X射线二维波前探测器设计与模拟

杨磊; 黄子文; 陆雨洁; 秦东旭; 王克逸; 张磊; 赵帅

doi:10.3724/j.0253-3219.2025.hjs.48.240461

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X射线二维波前探测器设计与模拟

同步辐射技术及应用 | 更新时间：2025-11-27

- X射线二维波前探测器设计与模拟
- Design and simulation of X-ray two-dimensional wavefront detector
- 核技术 2025年48卷第11期文章编号：110102
- 作者机构：
  
  1.中国科学技术大学精密机械与精密仪器系合肥 230027
  2.合肥工业大学电气与自动化工程学院合肥 230009
  3.中国科学技术大学国家同步辐射实验室合肥 230027
- 作者简介：
  
  杨磊，男，2001年出生，2023年毕业于中国矿业大学（北京），现为硕士研究生，研究领域为X射线二维相衬成像技术
  赵帅，E-mail：shuai.zhao@ustc.edu.cn
- 基金信息：
  
  国家重点研发计划(2023YFA1608602);同步辐射联合基金(KY2090000080;KY2090000142);中国博士后科学基金资助项目(2024M753120);中央高校基本科研业务费专项资金(WK2310000126)
- DOI：10.3724/j.0253-3219.2025.hjs.48.240461
  中图分类号： TL816⁺.1
- 收稿：2024-11-15，
  
  修回：2025-01-02，
  
  纸质出版：2025-11-15
- 稿件说明：
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杨磊,黄子文,陆雨洁等.X射线二维波前探测器设计与模拟[J].核技术,2025,48(11):110102.

YANG Lei,HUANG Ziwen,LU Yujie,et al.Design and simulation of X-ray two-dimensional wavefront detector[J].NUCLEAR TECHNIQUES,2025,48(11):110102.
杨磊,黄子文,陆雨洁等.X射线二维波前探测器设计与模拟[J].核技术,2025,48(11):110102. DOI： 10.3724/j.0253-3219.2025.hjs.48.240461. CSTR： 32193.14.hjs.CN31-1342/TL.2025.48.240461.

YANG Lei,HUANG Ziwen,LU Yujie,et al.Design and simulation of X-ray two-dimensional wavefront detector[J].NUCLEAR TECHNIQUES,2025,48(11):110102. DOI： 10.3724/j.0253-3219.2025.hjs.48.240461. CSTR： 32193.14.hjs.CN31-1342/TL.2025.48.240461.

摘要

随着第四代同步辐射光源和X射线自由电子激光等先进光源的发展，对高相干性和高亮度X射线进行精确的波前表征需求日益迫切，这对光束控制及光学元件的在线面形检测至关重要。为克服现有X射线波前探测方法在快速、准确获取二维波前相位信息方面的局限，本研究提出了一种基于X射线相衬成像技术的二维光栅波前探测器，该探测器由Checkerboard型相位光栅、Mesh型吸收光栅及X射线探测器组成。研究中建立了离散菲涅耳衍射模型和二维光栅模型，利用Python模拟了Checkerboard和Mesh光栅在π和π/2相移下4种组合的泰伯自成像特性，并分析了多种材料在8 keV和1 keV光子能量下π相移所需的光栅厚度和光子透过率。基于模拟结果，优化设计出适用于硬X射线和软X射线波段的二维波前探测器参数，并建立计算机数值仿真模型，生成干涉莫尔条纹图。通过在系统中加入PMMA小球模拟，并采用傅里叶变换方法恢复出小球引起的波前角度变化和波前面形分布，与预设值具有很好的一致性，验证了系统设计参数和数据处理方法的准确性。该研究为构建先进的二维波前表征与相位校正系统提供了重要参考。

Abstract

Background

With the construction and development of the Hefei Advanced Light Facility (HALF)

there is an increasing demand for precise wavefront characterization in high-coherence and high-brightness X-ray beamlines. This is crucial for optimizing beam quality and improving the accuracy of optical component testing. However

existing one-dimensional grating methods have limitations in capturing comprehensive wavefront phase information

making them less suitable for high-precision requirements.

Purpose

This study aims to develop a two-dimensional wavefront detector to meet the needs for more comprehensive and rapid wavefront characterization.

Methods

First

a discrete Fresnel diffraction propagation model was established for two-dimensional gratings to explore the self-imaging characteristics of different types of two-dimensional gratings

and grating parameters were designed based on the self-imaging position and period. Then

four combinations of Checkerboard and Mesh gratings with π and π/2 phase shifts were simulated using Python to analyze their Talbot self-imaging characteristics. The thickness required for π phase shifts and photon transmission rates for various materials were analyzed at 8 keV and 1 keV photon energies. Finally

the imaging process based on a polymethyl methacrylate (PMMA) sphere was simulated using the designed detector parameters

and the wavefront phase was extracted using Fourier fringe analysis to verify the feasibility of the method.

Results

Two-dimensional wavefront detector parameters suitable for both hard X-ray (8 keV) and soft X-ray (1 keV) bands are successfully designed

with phase grating thickness of 10.1 μm and 1.38 μm for silicon material

respectively. The Checkerboard-π phase grating combined with a Mesh absorption grating is determined to be the optimal configuration. The extracted PMMA sphere wavefront phase distribution shows excellent consistency in both perpendicular directions

with integrated phase shifts proportional to the sphere thickness.

Conclusions

This study provides a framework and theoretical reference for the development of X-ray two-dimensional wavefront detectors. Compared with traditional one-dimensional grating methods

the proposed detector can obtain wavefront phase information in two perpendicular directions simultaneously

offering greater flexibility and adaptability across both soft and hard X-ray energy ranges. The design parameters and phase recovery method demonstrate high accuracy and feasibility for advanced X-ray wavefront characterization systems.

关键词

Keywords

references

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