LIU Jichao,WANG Cheng,DAI Pengli.Study of the measurement of the thickness of diffusion aluminizing layer based on X-ray fluorescence[J].NUCLEAR TECHNIQUES,2020,43(02):60-67.
LIU Jichao,WANG Cheng,DAI Pengli.Study of the measurement of the thickness of diffusion aluminizing layer based on X-ray fluorescence[J].NUCLEAR TECHNIQUES,2020,43(02):60-67. DOI: 10.11889/j.0253-3219.2020.hjs.43.020201.