软X光低温辐射计

赵晓亮; 赵屹东; 唐坤; 郑雷; 刘树虎; 赵亚帅; 李凡; 崔明启

doi:10.11889/j.0253-3219.2018.hjs.41.040101

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软X光低温辐射计

同步辐射技术及应用 | 更新时间：2021-05-19

- 软X光低温辐射计
- Soft X-ray cryogenic radiometer
- 核技术 2018年41卷第4期文章编号：040101
- 作者机构：
  
  1.中国科学院高能物理研究所北京 100049
  2.中国科学院大学北京 100049
  3.中国科学院光电研究院北京 100094
- 作者简介：
  
  [ "赵晓亮, 男, 1988年出生, 2013年毕业于山东大学, 现为博士研究生, 主要从事同步辐射光学技术研究", "ZHAO Xiaoliang, male, born in 1988, graduated from Shandong University in 2013, doctoral student, focusing on synchrotron radiation X-ray optics and techniques" ]
  赵屹东, E-mail:zhaoyd@ihep.ac.cn ZHAO Yidong, E-mail: zhaoyd@ihep.ac.cn
- 基金信息：
  
  国家重大科学仪器专项(2012YQ130125);国家自然科学基金(11375227);国家自然科学基金(U1632264)
- DOI：10.11889/j.0253-3219.2018.hjs.41.040101
  中图分类号： O434.12
- 收稿日期：2017-11-28，
  
  修回日期：2018-01-11，
  
  纸质出版日期：2018-04-10
- 稿件说明：
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赵晓亮, 赵屹东, 唐坤, 等. 软X光低温辐射计[J]. 核技术, 2018,41(4):040101

Xiaoliang ZHAO, Yidong ZHAO, Kun TANG, et al. Soft X-ray cryogenic radiometer[J]. Nuclear techniques, 2018, 41(4): 040101
赵晓亮, 赵屹东, 唐坤, 等. 软X光低温辐射计[J]. 核技术, 2018,41(4):040101 DOI： 10.11889/j.0253-3219.2018.hjs.41.040101.

Xiaoliang ZHAO, Yidong ZHAO, Kun TANG, et al. Soft X-ray cryogenic radiometer[J]. Nuclear techniques, 2018, 41(4): 040101 DOI： 10.11889/j.0253-3219.2018.hjs.41.040101.

摘要

介绍了在北京同步辐射（Beijing Synchrotron Radiation Facility，BSRF）标定源的4B7B实验站上建立的一套软X光低温辐射计系统，用于测量从30nW~1μW范围的软X光功率。经多次实验发现：热沉和吸收体的温度稳定性以及热辐射背底涨落的控制是降低X光功率测量不确定度的关键。热沉的温度稳定是吸收体温度稳定的前提；吸收体上电加热功率根据待测X光功率调节，通过温度控制系统实现；低功率下X光功率测量不确定度受热辐射背底涨落的影响较大，通过优化热沉和吸收体的温度控制系统以及改进热链接的设计及工艺，使热沉的温度标准差控制在10 μK以下，吸收体的在15 μK以下。通过改善吸收体和热沉的受热环境，以及对通光管做特殊设计，控制热辐射背底的涨落在0.06 nW以内。对30 nW光功率的测试结果显示测量不确定度小于1%（

=1）。

Abstract

Background

There is no commercial soft X-ray cryogenic radiometer available for 4B7B experiment station on Beijing synchrotron radiation facility (BSRF).

Purpose

This study aims to design and implement a soft X-ray cryogenic radiometer to measure the X-ray power from 30nW to 1 μW for BSRF.

Method

Intensive experiments were performed to find the key points to reduce the uncertainties of X-ray power measurement. The temperature stabilities of the heat sink

the absorber and the control of thermal radiation background fluctuation are principal factors influencing the accuracy whilst the temperature stability of the heat sink is the precondition of the absorber temperature stability. The heating power on the absorber is determined by the X-ray power and adjusted by the temperature control system. And for low X-ray power measurement

the uncertainties can be affected by the fluctuation of thermal radiation background.

Result & Conclusion

Through optimizing the temperature control system of the heat sink and the absorber

and improving the design technics of the heat link

the standard deviation of the heat sink can be kept under 10 μK

and the absorber is kept under 15 μK. The fluctuation of thermal radiation background can be stabilized less than 0.06 nW by improving the thermal environment and design special light pipes. The result of 30 nW X-ray power measurement shows that total uncertainties are less than 1% (

=1).

关键词

Keywords

references

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