NaI闪烁体的快中子辐照损伤

余枭; 闫思齐; 文万信; 张保国; 王仁生; 刘汉洲

doi:10.11889/j.0253-3219.2017.hjs.40.120201

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NaI闪烁体的快中子辐照损伤

低能加速器技术、射线技术及应用 | 更新时间：2021-05-19

- NaI闪烁体的快中子辐照损伤
- Fast neutron radiation damage to NaI scintillator detector
- 核技术 2017年40卷第12期文章编号：120201
- 作者机构：
  
  1.苏州大学放射医学与防护学院苏州 215123
  2.江苏省高校放射医学协同创新中心苏州 215123
- 作者简介：
  
  [ "余枭, 男, 1994年出生, 2014年毕业于南方医科大学, 现为硕士研究生, 研究方向为医学物理", "YU Xiao, male, born in 1994, graduated from Southern Medical University in 2014, master student, focusing on medical physics" ]
  闫思齐, E-mail:yansiqi@suda.edu.cn YAN Siqi, ,E-mail:yansiqi@suda.edu.cn
  王仁生, E-mail:wrs16@suda.edu.cn WANG Rensheng, E-mail:wrs16@suda.edu.cn
- 基金信息：
  
  国家自然科学基金青年基金项目(11605119);江苏省自然科学基金青年项目(BK20160304);国家重大科学仪器专项子项(2013YQ04086102)
- DOI：10.11889/j.0253-3219.2017.hjs.40.120201
  中图分类号： TL99
- 收稿日期：2017-02-19，
  
  修回日期：2017-03-16，
  
  纸质出版日期：2017-12-10
- 稿件说明：
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余枭, 闫思齐, 文万信, 等. NaI闪烁体的快中子辐照损伤[J]. 核技术, 2017,40(12):120201

Xiao YU, Siqi YAN, Wanxin WEN, et al. Fast neutron radiation damage to NaI scintillator detector[J]. Nuclear techniques, 2017, 40(12): 120201
余枭, 闫思齐, 文万信, 等. NaI闪烁体的快中子辐照损伤[J]. 核技术, 2017,40(12):120201 DOI： 10.11889/j.0253-3219.2017.hjs.40.120201.

Xiao YU, Siqi YAN, Wanxin WEN, et al. Fast neutron radiation damage to NaI scintillator detector[J]. Nuclear techniques, 2017, 40(12): 120201 DOI： 10.11889/j.0253-3219.2017.hjs.40.120201.

摘要

中子瞬发γ活化分析（Prompt Gamma Neutron Activation Analysis，PGNAA）是工业物料成分检测的最主要方法之一，该方法通过大体积NaI闪烁体探测器测量物料被中子活化后的瞬发γ能谱来分析物料成分。测量过程中，NaI晶体处于较强的快中子场中，该快中子场对晶体的辐照损伤是影响NaI探测器性能的最主要因素，而NaI探测器的稳定性直接决定了PGNAA整体设备的性能。本文基于中国工程物理研究院CFBR-Ⅱ（ChinaFast Burst Reactor Ⅱ）型反应堆，精确地测量了NaI闪烁体在裂变中子场的10

-2

、10

-2

、10

-2

、10

-2

、10

-2

、10

-2

、10

-2

共7个中子注量照射后，NaI闪烁体组装的闪烁体探测器的性能变化。测量结果表明，NaI探测器除有较强的中子活化效应外，能量分辨率未发生显著变化，这为PGNAA设备中探测器的中子屏蔽设计和寿命估计提供了重要参数。

Abstract

Background

Prompt gamma neutron activation analysis (PGNAA) is an most important method to monitor the chemical compositions for bulk industrial materials. NaI detectors with large volume are often used for energy spectrum measurements of the prompt gamma rays in these cases. In the measurement

the NaI detectors are under a fast neutron field with large flux which is the primary factor of radiation damage to NaI crystal.

Purpose

This study aims to estimate the lifetime of the NaI crystal in the PGNAA quantificationally

and investigate the energy resolution evolution for the NaI crystal caused by the fast neutrons damage.

Methods

Based on the pulsed reactor CFBR-Ⅱ (China Fast Burst Reactor Ⅱ) in Chinese Academy of Engineering Physics (CAEP)

two pieces of NaI crystal were irradiated with the fast neutron flux of 10

-2

respectively. Meanwhile

the energy resolution was measured under each condition.

Results

The energy resolution of NaI does not show obvious changes with the fast neutron irradiation flux upto 10

-2

Conclusion

The energy resolution performance of NaI crystal does not deteriorate in fast neutron irradiation

except the strong neutron activation gamma rays. Therefore

to evaluate the lifetime of NaI crystal in a fast neutron field

a reliable lower limit can be figured out.

关键词

Keywords

references

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