一个PIXE-RBS离子束分析系统的刻度

夏川东; 刘慢天; 朱敬军; 安竹

doi:10.11889/j.0253-3219.2017.hjs.40.080201

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一个PIXE-RBS离子束分析系统的刻度

低能加速器技术、射线技术及应用 | 更新时间：2021-05-19

- 一个PIXE-RBS离子束分析系统的刻度
- Calibration of a PIXE-RBS ion beam analysis system
- 核技术 2017年40卷第8期文章编号：080201
- 作者机构：
  
  四川大学原子核科学技术研究所辐射物理及技术教育部重点实验室成都 610064
- 作者简介：
  
  [ "夏川东, 男, 1991年出生, 2014年毕业于四川大学, 现为硕士研究生, 从事核技术及应用研究", "XIA Chuandong, male, born in 1991, graduated from Sichuan University in 2014, master student, focusing on nuclear technology and its application" ]
  安竹, E-mail:anzhu@scu.edu.cnAN Zhu, E-mail:anzhu@scu.edu.cn
- 基金信息：
  
  中国工程物理研究院中子物理学重点实验室项目(2014BA06);国家自然科学基金(11175123)
- DOI：10.11889/j.0253-3219.2017.hjs.40.080201
  中图分类号： TL81
- 收稿日期：2017-01-15，
  
  修回日期：2017-03-22，
  
  纸质出版日期：2017-08-10
- 稿件说明：
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夏川东, 刘慢天, 朱敬军, 等. 一个PIXE-RBS离子束分析系统的刻度[J]. 核技术, 2017,40(8):080201

Chuandong XIA, Mantian LIU, Jingjun ZHU, et al. Calibration of a PIXE-RBS ion beam analysis system[J]. Nuclear techniques, 2017, 40(8): 080201
夏川东, 刘慢天, 朱敬军, 等. 一个PIXE-RBS离子束分析系统的刻度[J]. 核技术, 2017,40(8):080201 DOI： 10.11889/j.0253-3219.2017.hjs.40.080201.

Chuandong XIA, Mantian LIU, Jingjun ZHU, et al. Calibration of a PIXE-RBS ion beam analysis system[J]. Nuclear techniques, 2017, 40(8): 080201 DOI： 10.11889/j.0253-3219.2017.hjs.40.080201.

摘要

四川大学原子核科学技术研究所依托2.5MeV范德格拉夫静电加速器搭建了质子诱发X射线荧光分析（Proton Induced X-ray Emission，PIXE）与卢瑟福背散射分析（Rutherford Backscattering Spectrometry，RBS）相结合的离子束分析系统，描述了该分析系统和刻度过程。通过10个金属单质的PIXE-RBS测量，刻度得到的仪器常数

值是一条随能量变化的曲线，然后采用最小二乘法拟合确定了X射线探测器前的Mylar膜有效厚度、选择性滤膜的有效厚度和中心小孔大小，从而得到

值。为了对刻度

值进行检验，在相同实验条件下测量了标准粘土样品元素成分，测量数据与证书数据符合得较好。刻度结果将用于以后的PIXE-RBS分析。

Abstract

Background

An ion beam analysis system combining proton induced X-ray emission (PIXE) and Rutherford backscattering spectrometry (RBS) has been established based on the 2.5-MeV Van de Graaff accelerator facility in Institute of Nuclear Science and Technology

Sichuan University.

Purpose

Calibration of this PIXE-RBS system must be done before further quantitative analysis. The aim is to calibrate this PIXE-RBS system for future quantitative analysis.

Methods

10 single-element thick pure metal samples were measured by PIXE-RBS under experimental condition to determine the so-called instrumental constant

. The least square fit method was utilized to determine the effective thickness of Mylar and Al absorbers and aperture diameter of the funny filter in front of the X-ray detector.

Results

The measured

values calculated from experimental spectra for K-shell X-rays of ten single-element thick pure metal samples were a function of X-ray energy

and the

values recalculated using aforementioned three effective values became a constant. A clay standard sample was measured at the same experimental condition to test the accuracy of the calibration

and the measured elemental content values and certified values are in good agreement.

Conclusion

The accuracy of the calibration was satisfactory and the calibration results will be used for future PIXE-RBS analysis.

关键词

Keywords

references

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