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1.中国科学院上海应用物理研究所 嘉定园区 上海 201800
2.中国科学院大学 北京 100049
[ "边宇, 男, 1990年出生, 2012年毕业于四川大学, 现为博士研究生, 研究领域为自由电子激光", "BIAN Yu, male, born in1990, graduated from Sichuan University in 2012, doctoral student, focusing on free electron laser" ]
收稿日期:2016-10-17,
修回日期:2016-11-25,
纸质出版日期:2017-01
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边宇, 张文艳, 刘波, 等. 基于相干渡越辐射的束团长度测量研究[J]. 核技术, 2017,40(1):010102
Yu BIAN, Wenyan ZHANG, Bo LIU, et al. Measurement study of electron bunch length based on the coherent transition radiation[J]. Nuclear techniques, 2017, 40(1): 010102
边宇, 张文艳, 刘波, 等. 基于相干渡越辐射的束团长度测量研究[J]. 核技术, 2017,40(1):010102 DOI: 10.11889/j.0253-3219.2017.hjs.40.010102.
Yu BIAN, Wenyan ZHANG, Bo LIU, et al. Measurement study of electron bunch length based on the coherent transition radiation[J]. Nuclear techniques, 2017, 40(1): 010102 DOI: 10.11889/j.0253-3219.2017.hjs.40.010102.
电子束团长度是束流诊断中的重要参数,基于相干渡越辐射(Coherent Transition Radiation,CTR)的测量方法是一种简单易行的高时间分辨率测量方法。本文调研并分析了不同电子束团长度测量方法的优缺点,选择基于CTR方法作为主要研究方向,主要针对上海深紫外自由电子激光实验装置(Shanghai Deep Ultra-Violet Free Electron Laser,SDUV-FEL)和X射线自由电子激光试验装置(Shanghai X-ray Free Electron Laser,SXFEL)进行了实验方案设计和模拟分析。结果表明,通过合理的参数选择和方案优化,用该方法可对飞秒至皮秒范围内的束团长度进行测量,时间分辨率能到达飞秒量级,满足SDUV-FEL的实验需求和SXFEL的工程需求。
Background:
Longitudinal electron bunch length is an important parameter in accelerator beam diagnostics. It plays a significant role in single-pass free electron lasers
since the high-gain Free Electron Laser (FEL) process depends strongly on a high peak current of the electron bunches.
Purpose:
It is necessary to measure the electron bunch lengths in both Shanghai Deep Ultra-Violet Free Electron Laser (SDUV-FEL) and Shanghai X-ray Free Electron Laser (SXFEL).
Methods:
In this paper
the advantages and disadvantages of three standard diagnostic tools for bunch length measurement are compared and a measuring system based on coherent transition radiatio
n
(CTR) for SDUV-FEL and SXFEL is designed and analyzed.
Results:
The simulation shows that the measuring system can measure the electron bunch length from 20 fs to 1 ps effectively and time resolution of the measuring system can reach 20 fs.
Conclusion:
Electron bunch length measurement by means of CTR is an easy way to achieve high time resolution with inexpensive experimental instruments. The measuring system meets the demands of SDUV-FEL and SXFEL well.
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