星用介质材料深层充电效应仿真分析

安恒; 薛玉雄; 杨生胜; 庄凯; 秦秀波; 王俊

doi:10.11889/j.0253-3219.2016.hjs.39.120502

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星用介质材料深层充电效应仿真分析

核物理、交叉学科研究 | 更新时间：2021-05-24

- 星用介质材料深层充电效应仿真分析
- Analysis and simulation of dielectric deep charging effect for satellites
- 核技术 2016年39卷第12期文章编号：120502
- 作者机构：
  
  1.兰州空间技术物理研究所真空技术与物理重点实验室兰州 730000
  2.中国科学院高能物理研究所核分析技术重点实验室北京 100049
- 作者简介：
  
  [ "安恒, 男, 1982年出生, 2010年于山东大学获硕士学位, 研究领域为卫星辐射效应及抗辐射加固技术研究", "AN Heng, male, born in 1982, graduated from Shandong University with a master's degree in 2010, focusing on satellite radiation effect and radiation hardening" ]
- 基金信息：
  
  国家自然科学基金（No(No.11305084)
- DOI：10.11889/j.0253-3219.2016.hjs.39.120502
  中图分类号： TL99
- 收稿日期：2016-08-30，
  
  修回日期：2016-09-19，
  
  纸质出版日期：2016-12
- 稿件说明：
移动端阅览
安恒, 薛玉雄, 杨生胜, 等. 星用介质材料深层充电效应仿真分析[J]. 核技术, 2016,39(12):120502

Heng AN, Yuxiong XUE, Shengsheng YANG, et al. Analysis and simulation of dielectric deep charging effect for satellites[J]. Nuclear techniques, 2016, 39(12): 120502
安恒, 薛玉雄, 杨生胜, 等. 星用介质材料深层充电效应仿真分析[J]. 核技术, 2016,39(12):120502 DOI： 10.11889/j.0253-3219.2016.hjs.39.120502.

Heng AN, Yuxiong XUE, Shengsheng YANG, et al. Analysis and simulation of dielectric deep charging effect for satellites[J]. Nuclear techniques, 2016, 39(12): 120502 DOI： 10.11889/j.0253-3219.2016.hjs.39.120502.

摘要

高能带电粒子与航天器介质材料相互作用引起的深层带电现象，一直是威胁航天器安全运行的重要因素之一。随着航天器在轨飞行时间的增长，以及航天器飞行在中高轨道，其遭遇空间高能电子引起的介质深层充放电效应越来越严重。针对星用介质材料的深层充放电效应问题，提出了一种平板型多层结构的介质深层充放电分析模型，利用FLUKA仿真和带电分析程序分析了多层介质材料内部电荷沉积情况，研究了介质中叠合的金属层厚度和层数两个不同因素对充电电荷沉积的影响。仿真结果表明，建立的物理模型能有效地得到介质深层的电荷沉积分布特性，其研究结果可直接应用于空间辐射效应监测载荷中。

Abstract

Background:

Dielectric deep charge-discharge caused by interaction with energetic particles is always a threat to the safe operation of spaceflight. The long-time operation and flight in MEO and GEO would induce dielectric deep charge-discharge effect caused by energetic electron to become more and more serious.

Purpose:

The aim is to propose an analytic model for dielectric deep charging.

Methods:

The potentials of dielectric at certain depths are described by measurements of the potential of metallic layers inserted.

Results:

Simulations of two-type samples have been done based on Monto Carlo method and electric analyzing program

with one made of pure dielectric and the other consisting of both dielectric layers and metallic layers. Samples made of different thickness of dielectric layers and metallic layers

suitable thickness of dielectric layers and metallic layers can be determined aiding to design of the probe.

Conclusion:

The simulation result indicates that the model can be used to obtain dielectric deep charging characteristics effectively

which is beneficial to detector development of space radiation effect in future.

关键词

Keywords

references

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