星载数模转换器抗辐射性能评估测量系统研制

刘小敏; 姜慧强; 王志宇; 刘童; 陈华; 王立平; 郁发新

doi:10.11889/j.0253-3219.2016.hjs.39.110401

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星载数模转换器抗辐射性能评估测量系统研制

核电子学与仪器 | 更新时间：2021-05-24

- 星载数模转换器抗辐射性能评估测量系统研制
- Development of radiation tolerance evaluation and measurement system for spaceborne D/A converter
- 核技术 2016年39卷第11期文章编号：110401
- 作者机构：
  
  浙江大学航空航天学院杭州 310027
- 作者简介：
  
  [ "刘小敏,男,1991年出生,2014年毕业于浙江工业大学,现为硕士研究生,研究方向为集成电路设计与测量", "LIU Xiaomin, male, born in 1991, graduated from Zhejiang University of Technology in 2014, master student, focusing on the integrated circuit design and measurement" ]
  陈华,E-mail:chenhua@zju.edu.cn CHEN Hua, E-mail: chenhua@zju.edu.cn
- 基金信息：
  
  国家自然科学基金(No.61401395、No.61604128);中央高校基本科研业务费专项(No.2016QNA4025、No.2016QN81002);浙江省教育厅科研项目(No.Y201533913)
- DOI：10.11889/j.0253-3219.2016.hjs.39.110401
  中图分类号： TL8
- 收稿日期：2016-04-14，
  
  修回日期：2016-08-26，
  
  纸质出版日期：2016-11
- 稿件说明：
移动端阅览
刘小敏, 姜慧强, 王志宇, 等. 星载数模转换器抗辐射性能评估测量系统研制[J]. 核技术, 2016,39(11):110401

Xiaomin LIU, Huiqiang JIANG, Zhiyu WANG, et al. Development of radiation tolerance evaluation and measurement system for spaceborne D/A converter[J]. Nuclear techniques, 2016, 39(11): 110401
刘小敏, 姜慧强, 王志宇, 等. 星载数模转换器抗辐射性能评估测量系统研制[J]. 核技术, 2016,39(11):110401 DOI： 10.11889/j.0253-3219.2016.hjs.39.110401.

Xiaomin LIU, Huiqiang JIANG, Zhiyu WANG, et al. Development of radiation tolerance evaluation and measurement system for spaceborne D/A converter[J]. Nuclear techniques, 2016, 39(11): 110401 DOI： 10.11889/j.0253-3219.2016.hjs.39.110401.

摘要

刘小敏姜慧强王志宇刘童陈华王立平郁发新（浙江大学航空航天学院杭州310027）摘要基于面向仪器系统的外围组件互连扩展（Peripheral Component Interconnection extensions for Instrumentation，PXI）平台，提出并实现了一个高精度、高速、全自动星载数模转换器抗辐照性能评估测量系统。该系统采用开尔文四线法和均值滤波算法对芯片电流与电压进行高精度监测，利用软件配置矩阵开关全自动切换参数测量项，使用PXI总线同步与触发模式控制实现模块化仪器间的高速响应，并使用三次样条算法准确提取单粒子饱和截面与线性能量传输值阈值。基于该系统对一款自主研发的星载数模转换器进行辐照试验，试验结果表明研制的系统能够准确、高效地评估出器件抗辐照性能。系统电压识别精度为0.1 μV，最高可支持24位数模转换器监测，单粒子效应电流变化与寄存器翻转监测频率分别为50 Hz与100 Hz，总剂量效应时单次表征参数遍历时间为8 s。

Abstract

Background

The digital to analog converter (DAC) used in space-borne electronic system is unavoidable to be affected by the radiation

and it is essential to evaluate the DAC performance before formal application.

Purpose

This study aims to develop an automatic measurement system of high-accuracy and high-speed for radiation-tolerance evaluation of space-borne D/A converters.

Methods

Based on the peripheral component interconnection extensions for instrumentation (PXI)

Kelvin (4-wire) method and mean filtering algorithm are applied to accurately monitor the voltage and current of the DAC chip

and a switch matrix configured in software is adopted to automatically switch over measurements of different parameters. Meanwhile the PXI bus synchronization and trigger mode control are used to achieve high-speed response among modular instruments

and the cubic spline algorithm is performed to accurately extract the single event saturated cross section and linear energy transfer threshold.

Results

The identified voltage precision is 0.1 μV

and the DAC monitoring precision is up to 24 bit. In single event effects evaluation

the monitoring frequency of current variation and register upset are 50 Hz and 100 Hz respectively

and for total dose effect evaluation

only 8-s ergodic time are needed to measure all characteristic parameters.

Conclusion

The designed measurement system can evaluate the performance of space-born DAC fully automatically and efficiently with high precision

which is a reference solution to such similar research.

关键词

Keywords

references

X Y Hu , H C Chen , Kai Chen , . Development of COTS ADC SEE test system for the ATLAS LAr calorimeter upgrade . Nuclear Science and Techniques , 2014 . 25 ( 6 ): 060403 DOI: 10.13538/j.1001-8042/nst.25.060403 http://doi.org/10.13538/j.1001-8042/nst.25.060403 .

Kunnath A T, Sahoo B. A digitally assisted radiation hardened current steering DAC[C]. 201629th International Conference on VLSI Design and 201615th International Conference on Embedded Systems (VLSID), Kolkata, India:IEEE Computer Society, 2016:559-560 http://cn.bing.com/academic/profile?id=2294940015&encoded=0&v=paper_preview&mkt=zh-cn

K Kruckmeyer , J Prater , B Brown . Analysis of low dose rate effects on parasitic bipolar structures in CMOS processes for mixed-signal integrated circuits . IEEE Transactions on Nuclear Science , 2011 . 58 ( 3 ): 1023 - 1031 . DOI: 10.1109/TNS.2011.2116041 http://doi.org/10.1109/TNS.2011.2116041 .

Stone S, Lombardi R, Seehra S, et al. Single event effects characterization of Maxwell 7846B DAC[C]. Miami, Florida:IEEE Radiation Effects Data Workshop, 2012. DOI: 10.1109/REDW.2012.6353713 http://dx.doi.org/10.1109/REDW.2012.6353713 http://cn.bing.com/academic/profile?id=2037194179&encoded=0&v=paper_preview&mkt=zh-cn

王义元 , 陆妩 , 任迪远 . 不同 60 Co γ剂量率下10位双极D/A转换器的总剂量效应 . 原子能科学技术 , 2009 . 43 ( 10 ): 951 - 955 .

Yiyuan WANG , Wu LU , Diyuan REN . Total dose effect of 10-bit bipolar D/A converter under different 60 Co γ dose rates . Atomic Energy Science and Technology , 2009 . 43 ( 10 ): 951 - 955 .

王信 , 陆妩 , 郭旗 . 12位LC2MOS工艺数模转换器总剂量电离辐射效应 . 原子能科学技术 , 2013 . 47 ( 12 ): 2355 - 2360 . http://epub.cnki.net/kns/detail/detail.aspx?QueryID=22&CurRec=1&recid=&FileName=YZJS200910017&DbName=CJFD2009&DbCode=CJFQ&pr= .

Xin WANG , Wu LU , Qi GUO . Total ionizing dose effect on 12-bit LC2MOS digital-to-analog converter . Atomic Energy Science and Technology , 2013 . 47 ( 12 ): 2355 - 2360 . http://epub.cnki.net/kns/detail/detail.aspx?QueryID=22&CurRec=1&recid=&FileName=YZJS200910017&DbName=CJFD2009&DbCode=CJFQ&pr= .

王义元 , 陆妩 , 任迪远 . 12位双极数模转换器高低剂量率的辐射效应 . 核技术 , 2008 . 31 ( 9 ): 685 - 688 . http://www.cnki.com.cn/Article/CJFDTOTAL-HJSU200809010.htm .

Yiyuan WANG , Wu LU , Diyuan REN . Radiation effects of a 12-bit bipolar digital-to-analog converter under different dose rates . Nuclear Techniques , 2008 . 31 ( 9 ): 685 - 688 . http://www.cnki.com.cn/Article/CJFDTOTAL-HJSU200809010.htm .

薛玉雄 , 杨生胜 , 陈罗婧 . 空间单粒子锁定效应研究 . 核技术 , 2012 . 35 ( 9 ): 692 - 697 . http://www.cnki.com.cn/Article/CJFDTOTAL-HJSU201209010.htm .

Yuxiong XUE , Shengsheng YANG , Luojing CHEN . Investigation of single event latchup . Nuclear Techniques , 2012 . 35 ( 9 ): 692 - 697 . http://www.cnki.com.cn/Article/CJFDTOTAL-HJSU201209010.htm .

任学明 , 贺朝会 . 空间轨道单粒子翻转率预估的小样本法 . 原子能科学技术 , 2009 . 43 ( 2 ): 165 - 169 . http://www.cnki.com.cn/Article/CJFDTOTAL-YZJS200902015.htm .

Xueming REN , Chaohui HE . Small sample method for predicting single event upset rate in space orbits . Atomic Energy Science and Technology , 2009 . 43 ( 2 ): 165 - 169 . http://www.cnki.com.cn/Article/CJFDTOTAL-YZJS200902015.htm .

姚志斌 , 范如玉 , 郭红霞 . 静态单粒子翻转截面的获取及分类 . 强激光与粒子束 , 2011 . 23 ( 3 ): 811 - 816 . DOI: 10.3788/HPLPB http://doi.org/10.3788/HPLPB .

Zhibin YAO , Ruyu FAN , Hongxia GUO . Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs . High Power Laser and Particle Beams , 2011 . 23 ( 3 ): 811 - 816 . DOI: 10.3788/HPLPB http://doi.org/10.3788/HPLPB .

X Huang , J Huang . ADC/DAC loopback linearity testing by DAC output offsetting and scaling . IEEE Transactions on Very Large Scale Integration Systems , 2011 . 19 ( 10 ): 1765 - 1774 . DOI: 10.1109/TVLSI.2010.2063443 http://doi.org/10.1109/TVLSI.2010.2063443 .

Darco M, Liccardo A, Vadursi M. Design of a test equipment for DAC's performance assessment[C]. Instrumentation and Measurement Technology Conference, 2009:1232-1237 http://cn.bing.com/academic/profile?id=2096483406&encoded=0&v=paper_preview&mkt=zh-cn

Vavilina E, Gaigals G. Improved LabVIEW code generation[C]. 2015 IEEE 3rd Workshop on Advances in Information, Electronic and Electrical Engineering, 2015:1-4

Wang H, Li K, Li D. LabVIEW's code style and optimization[C]. International Conference on Measurement, Information and Control, 2013:1483-1486 http://cn.bing.com/academic/profile?id=2041376184&encoded=0&v=paper_preview&mkt=zh-cn

Zhang Q, Deng M, Zhang Q, et al. Design of data acquisition system based on SoPC and LabVIEW[C].2011 International Conference on Electrical and Control Engineering, IEEE, 2011:1036-1039 http://cn.bing.com/academic/profile?id=2147577952&encoded=0&v=paper_preview&mkt=zh-cn

QJ10005-2008:宇航用半导体器件重离子单粒子效应试验指南[S]. 北京:国家国防科技工业局, 2008

QJ10005-2008:Test guidelines of single event effects induced by heavy ions of semiconductor devices for space applications[S]. Beijing:State Administration of Science, Technology and Industry for National Defence, PRC, 2008

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