Background: Concerning radiation hardness assurance testing of microelectronic devices

there is rigorous requirement for the dose rate uniformity of irradiation field. With existing methods

the source rods of single-plate irradiation facility cannot be configured properly in the source plaque

which consequently form the prospected irradiation field. Purpose: This study aims to construct a new method to realize the optimal deployment of source rods and meet the requirements of radiation hardness assurance testing. Methods: The new method was realized by constructing mathematical model and designing improved greedy algorithm. The algorithm mainly contained three aspects. First of all

there was the thought of existing greedy algorithm

which is to determine position of source rods with the objective function defined by uniformity of dose rate at the reference points. In addition

the position of source rods was constricted according to empirical method. Finally

the global searching ability was improved by using enumeration technique. Results: For radiation hardness assurance testing

this method was able to construct irradiation field with dose rate uniformity no more than 1.02

and it was better and 100 times faster than the empirical method. As for irradiation process

the dose rate uniformity and efficiency obtained by this new method is similar to the existing methods such as greedy algorithm and plant growth simulation algorithm. Conclusion: This new method is effective for both the radiation hardness assurance testing and the irradiation process applications. Abstract