Background: Indirect Charge Coupled Device (CCD) using scintillator as a convertor of X-ray is widely used in synchrotron radiation X-ray imaging system. High detection efficiency and high spatial resolution of the detector are required to take advantages of the third generation synchrotron radiation light source. It has been proved that patterning the scintillator with photonic crystal (PhC) could increase the light output of the scintillator

thus enhancing the detection efficiency of scintillator-based detector. Purpose: In order to exploit the application of PhC in scintillator-based X-ray imaging detector

it is necessary to investigate the effect of PhC on the spatial resolution of the imaging detector. Methods: Three kinds of PhC

Polystyrene (PS)

Anodic Aluminum Oxide (AAO) and SiNx

were employed and superinduced on the Y3Al5O12:Ce scintillator basal. Imaging experiments with and without PhC were performed at the BL13W1 beamline of the Shanghai Synchrotron Radiation Facility (SSRF). The effect of PhC on the resolution was evaluated by comparing images of resolution bar taken by detector with and without PhC. Results: The homogeneity and the lattice type of the PhC

i.e.

SiNx have great impact on the spatial resolution. Conclusion: PhC with homogeneous structure is preferred to achieve better spatial resolution. Triangular lattice PhC performs better than the square lattice one in imaging detector. Abstract