Background: With the increased application of Field Programmable Gate Array (FPGA) in the field of spaceflight

Single Event Effect (SEE) of FPGA is attracting more and more attentions recently. Purpose: The aim is to study single event effect in flash-based FPGA manufactured by Microsemi. Methods: VersaTile and RAM Block from the flash-based FPGA are selected as the research object. First of all

the simulation verification of the method was performed by using ModelSim toolkit. Then the experimental tests of FPGA samples were carried out using SEE testbed based on the Heavy Ion Research Facility in Lanzhou (HIRFL). Results and Conclusion: The simulation results verify that the test methods are effective

and the Single Event Upset (SEU) are detected timely and accurately. Experimental results on the SEE test base using 86Kr of HIRFL showed its rationality and validation. Abstract