[1]余学锋,任迪远,陆妩,张国强,郭旗,严荣良.4000系列CMOS器件的电离辐射感生漏电流[J].核技术,1997(01):25-29.

Yu Xuefeng Ren Diyuan Lu Wu Zhang Guoqiang Guo Qi Yan Rongliang. Leakage current of the 4000 series CMOS devices induced by total dose ionizing radiation[J]. Nuclear techniques, 1997, (1).

[1]余学锋,任迪远,陆妩,张国强,郭旗,严荣良.4000系列CMOS器件的电离辐射感生漏电流[J].核技术,1997(01):25-29. DOI：

Yu Xuefeng Ren Diyuan Lu Wu Zhang Guoqiang Guo Qi Yan Rongliang. Leakage current of the 4000 series CMOS devices induced by total dose ionizing radiation[J]. Nuclear techniques, 1997, (1). DOI：