[1]任迪远,高文钰,余学锋,陆妩,张国强,范隆,罗来会,严荣良.半导体器件与电路辐照响应测试系统[J].核技术,1994(09):542-547.

A measurement system for investigating radiation effects of semiconductor devices and circuits[J]. Nuclear techniques, 1994, (9).

[1]任迪远,高文钰,余学锋,陆妩,张国强,范隆,罗来会,严荣良.半导体器件与电路辐照响应测试系统[J].核技术,1994(09):542-547. DOI：

A measurement system for investigating radiation effects of semiconductor devices and circuits[J]. Nuclear techniques, 1994, (9). DOI：