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中国科学院上海应用物理研究所
纸质出版日期:2010-05-01
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[1]张延乐,余笑寒.上海光源BL15U1束线的SRXRF定量分析[J].核技术,2010,33(05):334-337.
ZHANG Yanle YU Xiaohan. Quantitative SRXRF analysis on the BL15U1 beamline at SSRF[J]. Nuclear techniques, 2010, 33(5): 334-337.
本文介绍了用于同步辐射X射线荧光(XRF)定量分析的基本参数法(FP)和MC模拟法。上海光源(SSRF)硬X射线微聚焦光束线(BL15U1)应用上述两种方法对样品进行定量分析
验证了方法的有效性并用定量分析结果计算了BL15U1光束线部分元素的荧光探测限。实验结果表明
对样品中μg/g量级元素含量的定量分析结果相对误差都在10%以内
而使用MC模拟法可以直观地比较不同参数下的模拟谱与实验谱
辅助实验参数的确定
从而减小参数引起的误差
得到更为准确的结果。此外
对BL15U1探测限的计算表明该光束线具备开展高性能荧光实验的能力。
In this paper
we give an introduction first to two quantification methods for synchrotron radiation X-ray fluorescence analysis(SRXRF)
namely fundamental parameters method and Monte-Carlo simulation method
for their application on the BL15U1 beamline(hard X-ray microprobe) at SSRF(Shanghai Synchrotron Radiation Facility).Effectiveness of the two methods is demonstrated and the XRF detection limits of the BL15U1 beamline are calculated.The results show that
quantitative analysis at the ppm level can be done using the two methods
with an accuracy of better than 10%.Although both the methods are valid for the SRXRF data analysis
the Monte Carlo method gives better analysis result
as it compares the simulated spectrum with the experiment spectrum
and this helps the determination of experiment parameters and thus minimizes the error caused by incorrect parameters.Finally
the detection limits shows that the BL15U1 beamline is capable of carrying out standard-of-the-art XRF experiment.
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