TiN film was formed on iron substrate by Y ion beam dynamic enhanced deposition. The ratio of Y ions and Ti atoms arriving the film Y +:Ti=1:12. The film was characterized with AES
XRD and anode polarization analyses. A 50nm width of interlayer was formed between the film and the substrate. This process has an advantage over the non-IBED process in improving the corrosion resistance of TiN-iron sample.