ZHAO Jia1, 2 CUI Mingqi1 ZHAO Yidong1 ZHOU Kejin1 ZHENG Lei1 ZHU Jie1 SUN Lijuan1 CHEN Kai1 MA Chenyan1 1. The measurement of peak value diffraction efficiency of Si (111) crystal[J]. Nuclear techniques, 2007, (6): 511-515.
ZHAO Jia1, 2 CUI Mingqi1 ZHAO Yidong1 ZHOU Kejin1 ZHENG Lei1 ZHU Jie1 SUN Lijuan1 CHEN Kai1 MA Chenyan1 1. The measurement of peak value diffraction efficiency of Si (111) crystal[J]. Nuclear techniques, 2007, (6): 511-515.DOI:
This paper presented an experimental method for measuring diffraction efficiencies of crystals with synchrotron radiation source. The rationality and reliability of this method were proved by analysis and correction the theoretical data of a Si (111) standard sample. High correlation was found between the diffraction efficiency and source emittance.