By using monolithic parallel beam X-ray lens instead of the attachment slits or Soller slits

the X-ray intensities both incident on and diffracted from the sample can be 1.5—3.5 times than the original and a resolution of 0.4°can be reached

thus the diffractional setup with X-ray lenses can be used to analyse thin film

powder and ion beam deposit samples. By using the slightly focusing X-ray lens in the macromolecular crystallography

high pressure and four circle X-ray diffractometers and at the same electric power supply

the diffracted intensities can be raised 3—10 times than the traditional diffractional equipment. In addition the signal to noise ratio and the resolution can be improved to a certain extent.