Erkin YAN Rongliang YU Xuefeng GUO Qi LU Wu REN Diyuan. The irradiation degeneration of AC characteristic of 54HCT244 high-speed CMOS circuits[J]. Nuclear techniques, 2003, (4): 287-290.
Erkin YAN Rongliang YU Xuefeng GUO Qi LU Wu REN Diyuan. The irradiation degeneration of AC characteristic of 54HCT244 high-speed CMOS circuits[J]. Nuclear techniques, 2003, (4): 287-290.DOI:
The radiation effects of the home-made high-speed CMOS circuits 54HCT244 have been studied. The results indicated that the degenerations of delay time TPHL under low dose rate is more seriously than that under high dose rate for the radiation-hardened devices. It is also shown that the radiation bias exerted serious effects on the radiation-hardened devices.