乐安全, 韩发生, 徐君权, 等. 金镀层测厚仪[J]. 核技术, 1985,08(9):1-4,51.

Anquan Le, Fasheng Han, Junquan Xu, et al. A thickness gauge used for measuring the gold plating layer[J]. Nuclear techniques, 1985, 08(9): 1-4,51.

乐安全, 韩发生, 徐君权, 等. 金镀层测厚仪[J]. 核技术, 1985,08(9):1-4,51. DOI：

Anquan Le, Fasheng Han, Junquan Xu, et al. A thickness gauge used for measuring the gold plating layer[J]. Nuclear techniques, 1985, 08(9): 1-4,51. DOI：