沈景兰. 同位素源磁带涂层在线X射线荧光测厚仪[J]. 核技术, 1985,08(5):29-29,61.

Jinglan Shen. On-line radioisotope X-ray fluorescence instrument used for the thickness measurement of coating layer on tapes[J]. Nuclear techniques, 1985, 08(5): 29-29,61.

沈景兰. 同位素源磁带涂层在线X射线荧光测厚仪[J]. 核技术, 1985,08(5):29-29,61. DOI：

Jinglan Shen. On-line radioisotope X-ray fluorescence instrument used for the thickness measurement of coating layer on tapes[J]. Nuclear techniques, 1985, 08(5): 29-29,61. DOI：