Under some conditions

there is a simple hyperbola function relationship between the ratio of the characteristic X-ray intensity of an element analysed to Compton scattering intensity by primary X-ray and the ratio of the characteristic X-ray intensity of the element to the intensity measured with a absorbent filter. The hyperbola function relationship enables us to improve the matrix effect easily by using the method of "characteristic/scattering ratio" with a portable radioisotope X-ray fluorescence single channel analyzer. The results of this new method is fairly identical with that of "characteristic/scattering ratio". Besides

there is no need of extra devices and it saves time and money. Many types of Sn samples and one type of Cu sample have been analysed.