您当前的位置：
首页 >
文章列表页 >
A dataset of single event effect and on-orbit reliability evaluation of multi-core processor SoC
DATA ARTICLES | 更新时间：2026-07-14

    • A dataset of single event effect and on-orbit reliability evaluation of multi-core processor SoC

    • NUCLEAR TECHNIQUES   Vol. 49, Issue 6, Article number: 060704(2026)

    • DOI：10.3724/j.0253-3219.2026.hjs.49.260143    

      CLC： TL99

    • Received：10 April 2026，

      Revised：2026-05-24，

      Published：15 June 2026

    移动端阅览

  • QIN Fengdi,ZHANG Fuqiang,CHEN Qiming,et al.A dataset of single event effect and on-orbit reliability evaluation of multi-core processor SoC[J].NUCLEAR TECHNIQUES,2026,49(06):060704. DOI： 10.3724/j.0253-3219.2026.hjs.49.260143. CSTR： 32193.14.hjs.CN31-1342/TL.2026.49.260143.

  •  
  •  

0

Views

11

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

A dataset for thermal stratification phenomenon in lead-cooled fast reactors
A dataset of thermal striping at the reactor core outlet
Accelerator simulation test technology and its application for single event effect evaluation in space
Recent progress and development trend of femtosecond pulsed-laser for single event effects assessment
Design and implementation of a high-precision feed-forward system for SSRF insertion devices

Related Author

CAI Weihua
XUE Keying
XIE Yongfan
WANG Yue
LI Xiaobin
ZHANG Hongna
LI Fengchen
WANG Xin

Related Institution

School of Mechanical Engineering, Tianjin University
School of Energy and Power Engineering, Northeast Electric Power University
China Nuclear Power Technology Research Institute Co., Ltd.
China Institute of Atomic Energy, National Innovation Center of Radiation Application
Lanzhou Institute of Physics, Science and Technology on Vacuum Technology and Physics Laboratory
0