Design and simulation of X-ray two-dimensional wavefront detector

YANG Lei; HUANG Ziwen; LU Yujie; QIN Dongxu; WANG Keyi; ZHANG Lei; ZHAO Shuai

doi:10.3724/j.0253-3219.2025.hjs.48.240461

您当前的位置：

首页 >

文章列表页 >

Design and simulation of X-ray two-dimensional wavefront detector

SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS | 更新时间：2025-11-27

- Design and simulation of X-ray two-dimensional wavefront detector
- NUCLEAR TECHNIQUES Vol. 48, Issue 11, Article number: 110102(2025)
- 作者机构：
  
  1.中国科学技术大学精密机械与精密仪器系合肥 230027
  2.合肥工业大学电气与自动化工程学院合肥 230009
  3.中国科学技术大学国家同步辐射实验室合肥 230027
- 作者简介：
  
  YANG Lei, male, born in 2001, graduated from China University of Mining and Technology (Beijing) in 2023, master student, focusing on X-ray two-dimensional phase contrast imaging technology
  ZHAO Shuai, E-mail: shuai.zhao@ustc.edu.cn
- 基金信息：
  
  National Key Research and Development Program of China(2023YFA1608602);Synchrotron Radiation Joint Fund(KY2090000080;KY2090000142);China Postdoctoral Science Foundation(2024M753120);Fundamental Research Funds for the Central Universities(WK2310000126)
- DOI：10.3724/j.0253-3219.2025.hjs.48.240461
  CLC： TL816⁺.1
- Received：15 November 2024，
  
  Revised：2025-01-02，
  
  Published：15 November 2025
- 稿件说明：
移动端阅览
杨磊,黄子文,陆雨洁等.X射线二维波前探测器设计与模拟[J].核技术,2025,48(11):110102.

YANG Lei,HUANG Ziwen,LU Yujie,et al.Design and simulation of X-ray two-dimensional wavefront detector[J].NUCLEAR TECHNIQUES,2025,48(11):110102.
杨磊,黄子文,陆雨洁等.X射线二维波前探测器设计与模拟[J].核技术,2025,48(11):110102. DOI： 10.3724/j.0253-3219.2025.hjs.48.240461. CSTR： 32193.14.hjs.CN31-1342/TL.2025.48.240461.

YANG Lei,HUANG Ziwen,LU Yujie,et al.Design and simulation of X-ray two-dimensional wavefront detector[J].NUCLEAR TECHNIQUES,2025,48(11):110102. DOI： 10.3724/j.0253-3219.2025.hjs.48.240461. CSTR： 32193.14.hjs.CN31-1342/TL.2025.48.240461.

摘要

随着第四代同步辐射光源和X射线自由电子激光等先进光源的发展，对高相干性和高亮度X射线进行精确的波前表征需求日益迫切，这对光束控制及光学元件的在线面形检测至关重要。为克服现有X射线波前探测方法在快速、准确获取二维波前相位信息方面的局限，本研究提出了一种基于X射线相衬成像技术的二维光栅波前探测器，该探测器由Checkerboard型相位光栅、Mesh型吸收光栅及X射线探测器组成。研究中建立了离散菲涅耳衍射模型和二维光栅模型，利用Python模拟了Checkerboard和Mesh光栅在π和π/2相移下4种组合的泰伯自成像特性，并分析了多种材料在8 keV和1 keV光子能量下π相移所需的光栅厚度和光子透过率。基于模拟结果，优化设计出适用于硬X射线和软X射线波段的二维波前探测器参数，并建立计算机数值仿真模型，生成干涉莫尔条纹图。通过在系统中加入PMMA小球模拟，并采用傅里叶变换方法恢复出小球引起的波前角度变化和波前面形分布，与预设值具有很好的一致性，验证了系统设计参数和数据处理方法的准确性。该研究为构建先进的二维波前表征与相位校正系统提供了重要参考。

Abstract

Background

With the construction and development of the Hefei Advanced Light Facility (HALF)

there is an increasing demand for precise wavefront characterization in high-coherence and high-brightness X-ray beamlines. This is crucial for optimizing beam quality and improving the accuracy of optical component testing. However

existing one-dimensional grating methods have limitations in capturing comprehensive wavefront phase information

making them less suitable for high-precision requirements.

Purpose

This study aims to develop a two-dimensional wavefront detector to meet the needs for more comprehensive and rapid wavefront characterization.

Methods

First

a discrete Fresnel diffraction propagation model was established for two-dimensional gratings to explore the self-imaging characteristics of different types of two-dimensional gratings

and grating parameters were designed based on the self-imaging position and period. Then

four combinations of Checkerboard and Mesh gratings with π and π/2 phase shifts were simulated using Python to analyze their Talbot self-imaging characteristics. The thickness required for π phase shifts and photon transmission rates for various materials were analyzed at 8 keV and 1 keV photon energies. Finally

the imaging process based on a polymethyl methacrylate (PMMA) sphere was simulated using the designed detector parameters

and the wavefront phase was extracted using Fourier fringe analysis to verify the feasibility of the method.

Results

Two-dimensional wavefront detector parameters suitable for both hard X-ray (8 keV) and soft X-ray (1 keV) bands are successfully designed

with phase grating thickness of 10.1 μm and 1.38 μm for silicon material

respectively. The Checkerboard-π phase grating combined with a Mesh absorption grating is determined to be the optimal configuration. The extracted PMMA sphere wavefront phase distribution shows excellent consistency in both perpendicular directions

with integrated phase shifts proportional to the sphere thickness.

Conclusions

This study provides a framework and theoretical reference for the development of X-ray two-dimensional wavefront detectors. Compared with traditional one-dimensional grating methods

the proposed detector can obtain wavefront phase information in two perpendicular directions simultaneously

offering greater flexibility and adaptability across both soft and hard X-ray energy ranges. The design parameters and phase recovery method demonstrate high accuracy and feasibility for advanced X-ray wavefront characterization systems.

关键词

Keywords

references

焦广为 , 田顺强 , 相升旺 , 等 . 同步辐射光源新增线站相关加速器安装与调试 [J ] . 核技术 , 2024 , 47 ( 3 ): 030101 . DOI: 10.11889/j.0253-3219.2024.hjs.47.030101 http://dx.doi.org/10.11889/j.0253-3219.2024.hjs.47.030101 .

JIAO Guangwei , TIAN Shunqiang , XIANG Shengwang , et al . Installation and commissioning of accelerators associated with the new beamline in synchrotron radiation light source [J ] . Nuclear Techniques , 2024 , 47 ( 3 ): 030101 . DOI: 10.11889/j.0253-3219.2024.hjs.47.030101 http://dx.doi.org/10.11889/j.0253-3219.2024.hjs.47.030101 .

赵帅 . X射线光学元件在线波前检测与精密制造技术研究 [D ] . 合肥 : 中国科学技术大学 , 2023 .

ZHAO Shuai . Research on online X-ray optics wavefront characterization and precision fabrication technology [D ] . Hefei : University of Science and Technology of China , 2023 .

赵帅 , 王秋平 , 张磊 , 等 . 基于微焦点X射线光栅干涉仪的波前传感与面形测量技术 [J ] . 光学学报 , 2022 , 42 ( 23 ): 2334002 . DOI: 10.3788/AOS202242.2334002 http://dx.doi.org/10.3788/AOS202242.2334002 .

ZHAO Shuai , WANG Qiuping , ZHANG Lei , et al . Wavefront sensing and surface shape measurement based on microfocus X-ray grating interferometer [J ] . Acta Optica Sinica , 2022 , 42 ( 23 ): 2334002 . DOI: 10.3788/AOS202242.2334002 http://dx.doi.org/10.3788/AOS202242.2334002 .

Mercère P , Idir M , Moreno T , et al . Automatic alignment of a Kirkpatrick-Baez active optic by use of a soft-X-ray Hartmann wavefront sensor [J ] . Optics Letters , 2006 , 31 ( 2 ): 199 – 201 . DOI: 10.1364/ol.31.000199 http://dx.doi.org/10.1364/ol.31.000199 .

Idir M , Mercere P , Modi M H , et al . X-ray active mirror coupled with a Hartmann wavefront sensor [J ] . Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2010 , 616 ( 2–3 ): 162 – 171 . DOI: 10.1016/j.nima.2009.10.168 http://dx.doi.org/10.1016/j.nima.2009.10.168 .

Keitel B , Plönjes E , Kreis S , et al . Hartmann wavefront sensors and their application at FLASH [J ] . Journal of Synchrotron Radiation , 2016 , 23 ( 1 ): 43 – 49 . DOI: 10.1107/S1600577515020354 http://dx.doi.org/10.1107/S1600577515020354 .

李凡 , 康乐 , 杨福桂 , 等 . 基于X射线近场散斑的波前检测技术研究现状 [J ] . 光学学报 , 2022 , 42 ( 8 ): 0800002 . DOI: 10.3788/AOS202242.0800002 http://dx.doi.org/10.3788/AOS202242.0800002 .

LI Fan , KANG Le , YANG Fugui , et al . Present research status of X-ray near-field speckle based wavefront metrology [J ] . Acta Optica Sinica , 2022 , 42 ( 8 ): 0800002 . DOI: 10.3788/AOS202242.0800002 http://dx.doi.org/10.3788/AOS202242.0800002 .

Berujon S , Wang H C , Alcock S , et al . At-wavelength metrology of hard X-ray mirror using near field speckle [J ] . Optics Express , 2014 , 22 ( 6 ): 6438 – 6446 . DOI: 10.1364/OE.22.006438 http://dx.doi.org/10.1364/OE.22.006438 .

Xue L , Li Z L , Zhou T , et al . Absolute metrology method of the X-ray mirror with speckle scanning technique [J ] . Applied Optics , 2019 , 58 ( 31 ): 8658 – 8664 . DOI: 10.1364/AO.58.008658 http://dx.doi.org/10.1364/AO.58.008658 .

Zhao S , Yang Y , Shen Y , et al . Optics metrology and at-wavelength wavefront characterization by a microfocus X-ray grating interferometer [J ] . Optics Express , 2021 , 29 ( 14 ): 2 2704– 22713 . DOI: 10.1364/OE.430269 http://dx.doi.org/10.1364/OE.430269 .

Shuai Z , Wang K Y , Cheng G Y , et al . X-ray wavefront characterization with grating interferometry using an X-ray microfocus laboratory source [C ] . USA : Advances in Metrology for X-Ray and EUV Optics IX , 2020 . SPIE , 2020. DOI: 10.1117/12.2576152 http://dx.doi.org/10.1117/12.2576152 .

Wang H C , Sawhney K , Berujon S , et al . X-ray wavefront characterization using a rotating shearing interferometer technique [J ] . Optics Express , 2011 , 19 ( 17 ): 1 6550– 16559 . DOI: 10.1364/OE.19.016550 http://dx.doi.org/10.1364/OE.19.016550 .

Berujon S , Ziegler E . Grating-based at-wavelength metrology of hard X-ray reflective optics [J ] . Optics Letters , 2012 , 37 ( 21 ): 4464 – 4466 . DOI: 10.1364/OL.37.004464 http://dx.doi.org/10.1364/OL.37.004464 .

Liu Y W , Seaberg M , Zhu D L , et al . High-accuracy wavefront sensing for X-ray free electron lasers [J ] . Optica , 2018 , 5 ( 8 ): 967 . DOI: 10.1364/optica.5.000967 http://dx.doi.org/10.1364/optica.5.000967 .

Rutishauser S . X-ray grating interferometry for imaging and metrology [D ] . ETH Zurich , 2013 . DOI: 10.3929/ETH Z-A-009753.051 http://dx.doi.org/10.3929/ETHZ-A-009753.051 .

Snigirev A , Snigireva I , Kohn V , et al . On the possibilities of X‐ray phase contrast microimaging by coherent high‐energy synchrotron radiation [J ] . Review of Scientific Instruments , 1995 , 66 ( 12 ): 5486 – 5492 . DOI: 10.1063/1.1146073 http://dx.doi.org/10.1063/1.1146073 .

Vila-Comamala J , Romano L , Jefimovs K , et al . High sensitivity X-ray phase contrast imaging by laboratory grating-based interferometry at high Talbot order geometry [J ] . Optics Express , 2021 , 29 ( 2 ): 2049 – 2064 . DOI: 10.1364/OE.414174 http://dx.doi.org/10.1364/OE.414174 .

Pfeiffer F , Weitkamp T , Bunk O , et al . Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources [J ] . Nature Physics , 2006 , 2 : 258 – 261 . DOI: 10.1038/nphys265 http://dx.doi.org/10.1038/nphys265 .

Takeda M , Ina H , Kobayashi S . Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry [J ] . Journal of the Optical Society of America , 1982 , 72 ( 1 ): 156 . DOI: 10.1364/josa.72.000156 http://dx.doi.org/10.1364/josa.72.000156 .

Bevins N , Zambelli J , Li K , et al . Multicontrast X-ray computed tomography imaging using Talbot-Lau interferometry without phase stepping [J ] . Medical Physics , 2012 , 39 ( 1 ): 424 – 428 . DOI: 10.1118/1.3672163 http://dx.doi.org/10.1118/1.3672163 .

邓超 , 胡保进 , 周梁缘 , 等 . 合肥先进光源磁铁电源自优化控制器设计 [J ] . 核技术 , 2025 , 48 ( 5 ): 050201 . DOI: 10.11889/j.0253-3219.2025.hjs.48.240276 http://dx.doi.org/10.11889/j.0253-3219.2025.hjs.48.240276 .

DENG Chao , HU Baojin , ZHOU Liangyuan , et al . Design of a self-optimizing magnet power supply controller for the Hefei advanced light facility [J ] . Nuclear Techniques , 2025 , 48 ( 5 ): 050201 . DOI: 10.11889/j.0253-3219.2025.hjs.48.240276 http://dx.doi.org/10.11889/j.0253-3219.2025.hjs.48.240276 .

张天哲 , 孔安博 , 陈凯 , 等 . 合肥光源飞扫控制系统研制 [J ] . 核技术 , 2024 , 47 ( 2 ): 020103 . DOI: 10.11889/j.0253-3219.2024.hjs.47.020103 http://dx.doi.org/10.11889/j.0253-3219.2024.hjs.47.020103 .

ZHANG Tianzhe , KONG Anbo , CHEN Kai , et al . Development of on-the-fly mode control system for Hefei Light Source [J ] . Nuclear Techniques , 2024 , 47 ( 2 ): 020103 . DOI: 10.11889/j.0253-3219.2024.hjs.47.020103 http://dx.doi.org/10.11889/j.0253-3219.2024.hjs.47.020103 .

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Novel X-ray refractive lenses

Shielding mechanism of medical X-ray and the shielding characteristics of flexible protective materials

Research status and prospect of combined X-ray and neutron imaging technology

Monte Carlo simulation analysis of X-ray density logging shields

Depth-of-investigation characteristics and influence of 350-kV high-voltage X-ray density logging

Related Author

LU Tongsuo

HUANG Guoliang

REN Zuyang

XU Yuanze

ZHANG Yaowu

LIU Jing

ZHANG Weiwei

HUANG Qiyu

Related Institution

College of Science, Tibet University

Shanghai Advanced Research Institute, Chinese Academy of Sciences

Institute of High Energy Physics, Chinese Academy of Sciences

School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University

School of Mechanical Engineering, Shanghai Jiao Tong University

AI脑图

AI问答

Address：2019 Jialuo Road, Jiading, Shanghai, China Postal code：201800
Tel：021-39194977 Email：LHB@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.
Total Visits：1032130

⁰