Research on the total ionizing dose effects of a BCD process encoder control circuit
NUCLEAR ELECTRONICS AND INSTRUMENTATION|更新时间:2025-09-01
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Research on the total ionizing dose effects of a BCD process encoder control circuit
“In the field of BCD process optoelectronic encoder control circuit, experts have conducted research on the ionizing total dose radiation effect, revealing the radiation damage mechanism of the encoder and providing solutions to improve the circuit's radiation resistance.”
XU Shiping, female, born in 1998, graduated from University of Electronic Science and Technology of China in 2020, doctoral student, focusing on radiation effects of semiconductor devices
CUI Jiangwei, E-mail: cuijw@ms.xjb.ac.cn
LI Yudong, E-mail: lydong@ms.xjb.ac.cn
基金信息:
National Key Research and Development Program of China(2021YFB2401602);National Natural Science Foundation of China(12275352;12475290);Natural Science Foundation of Xinjiang Uygur Autonomous Region(2022D01E92);Youth Science and Technology Innovation Project of Xinjiang Uyghur Autonomous Region(2022TSYCCX0075;2022TSYCCX0014)
XU Shiping,CUI Jiangwei,ZHENG Qiwen,et al.Research on the total ionizing dose effects of a BCD process encoder control circuit[J].NUCLEAR TECHNIQUES,2025,48(08):080404.