Performance test of front-end ASIC chip CSNS_VASD developed for China Spallation Neutron Source
NUCLEAR ELECTRONICS AND INSTRUMENTATION|更新时间:2024-10-25
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Performance test of front-end ASIC chip CSNS_VASD developed for China Spallation Neutron Source
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“In the field of neutron source engineering, the CSNS-VASD chip developed by Chinese experts has verified the performance of the detector and provided technical support for the smooth construction of the project.”
YANG Hao, male, born in 1996, graduated from Zhengzhou University with a master degree in 2023, focusing on nuclear electronics and specialized integrated circuit technology
LU Shuxiang, E-mail: lushuxiang@zzu.edu.cn
CHEN Shaojia, E-mail: sjchen@ihep.ac.cn
基金信息:
Foundation and Application of Guangdong Province with Basic Research Fund(2020B1515120025);National Natural Science Foundation of China(11875273)
YANG Hao,LU Shuxiang,LI Huaishen,et al.Performance test of front-end ASIC chip CSNS_VASD developed for China Spallation Neutron Source[J].NUCLEAR TECHNIQUES,2024,47(07):070401-070401.
YANG Hao,LU Shuxiang,LI Huaishen,et al.Performance test of front-end ASIC chip CSNS_VASD developed for China Spallation Neutron Source[J].NUCLEAR TECHNIQUES,2024,47(07):070401-070401. DOI: 10.11889/j.0253-3219.2024.hjs.47.070401.
Performance test of front-end ASIC chip CSNS_VASD developed for China Spallation Neutron Source增强出版