您当前的位置：
首页 >
文章列表页 >
Development of extendable on-line test system for total ionizing dose effect of microprocessor
NUCLEAR ELECTRONICS AND INSTRUMENTATION | 更新时间：2024-10-25
|

    • Development of extendable on-line test system for total ionizing dose effect of microprocessor

    • “In the field of microprocessor total dose effect testing, researchers have developed a scalable online testing system that provides direct data for failure mode analysis.”
    • NUCLEAR TECHNIQUES   Vol. 45, Issue 11, Article number: 110404(2022)

    • DOI：10.11889/j.0253-3219.2022.hjs.45.110404    

      CLC： TL99

    • Received：13 September 2022，

      Revised：20 October 2022，

      Published：15 November 2022

    移动端阅览

  • CHEN Faguo,YU Weiyue,LIANG Runcheng,et al.Development of extendable on-line test system for total ionizing dose effect of microprocessor[J].NUCLEAR TECHNIQUES,2022,45(11):110404 DOI： 10.11889/j.0253-3219.2022.hjs.45.110404.

  •  
  •  

0

Views

95

下载量

2

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Gamma ray irradiation response of the trench MOSFET amplifier
Total ionizing dose effect of enhanced AlGaN/GaN HEMT devices under different bias
Radiation effect sensitive peripheral of 180 nm CMOS microprocessor and probabilistic model analysis of its damage dose
Experimental study on irradiation damage dose of 180 nm CMOS MCU
Radon measurement in α energy spectrum and its influence factors

Related Author

YANG Tinggui
ZHANG Wei
LUO Yuwen
NONG Shuying
TANG Jun
ZHOU Xinjie
ZHANG Pingwei
YIN Yanan

Related Institution

The Company Limited, China National Nuclear Corperation
Gansu Key Laboratory of Nuclear Fuel Cycle Technology
China National Nuclear Wuhan Nuclear Power Operation Technology Co., Ltd.
State Key Laboratory of Functional Materials and Devices for Special Environmental Conditions, Xinjiang Key Laboratory of Extreme Environment Electronics, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences
China Electronics Technology Group Corporation No.58 Research Institute
0