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Effects of surface roughness on measurements of characteristic X-ray yields of thick Ni target by low-energy electron impact
ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS | 更新时间：2024-10-25
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    • Effects of surface roughness on measurements of characteristic X-ray yields of thick Ni target by low-energy electron impact

    • “In low-energy electron incident thick Ni target experiments, the surface roughness of the target will affect the characteristic X-ray yield. The experimental results are in good agreement with the calculated values of DWBA theory, providing important reference for the study of the ionization cross-section of the inner shell of electron induced thick target atoms.”
    • NUCLEAR TECHNIQUES   Vol. 44, Issue 11, Article number: 110201(2021)

    • DOI：10.11889/j.0253-3219.2021.hjs.44.110201    

      CLC： TL814

    • Received：13 July 2021，

      Revised：12 October 2021，

      Published：15 November 2021

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  • TIAN Lixia,YIN Yi,DAI Chaocheng.Effects of surface roughness on measurements of characteristic X-ray yields of thick Ni target by low-energy electron impact[J].NUCLEAR TECHNIQUES,2021,44(11):20-24. DOI： 10.11889/j.0253-3219.2021.hjs.44.110201.

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