Experimental study on the total ionizing dose effects of nonvolatile RRAM
“In the aerospace field, research on the radiation resistance of new non-volatile memory RRAM has made progress. Experts analyzed the total dose effect failure mechanism of RRAM and provided solutions to improve the reliability of spacecraft electronic systems.”
NUCLEAR TECHNIQUESVol. 43, Issue 12, (2020)
作者机构:
兰州空间技术物理研究所 空间环境材料行为与评价重点实验室 兰州 730000
作者简介:
CHANG Siyuan, male, born in 1994, graduated from Harbin Institute of Technology in 2017, master student, focusing on space environmental effects and control
YANG Shengsheng, E-mail: 2syang@sina.com
基金信息:
National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment
CHANG Siyuan,YANG Shengsheng,WEN Xuan,et al.Experimental study on the total ionizing dose effects of nonvolatile RRAM[J].NUCLEAR TECHNIQUES,2020,43(12):65-71.
CHANG Siyuan,YANG Shengsheng,WEN Xuan,et al.Experimental study on the total ionizing dose effects of nonvolatile RRAM[J].NUCLEAR TECHNIQUES,2020,43(12):65-71. DOI: 10.11889/j.0253-3219.2020.hjs.43.120502.
Experimental study on the total ionizing dose effects of nonvolatile RRAM