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Simultaneous quick measurements of combined synchrotron EDXAFS and EDXRD
SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS | 更新时间：2024-10-25
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    • Simultaneous quick measurements of combined synchrotron EDXAFS and EDXRD

    • “In the field of materials research, scientists have proposed a testing scheme that combines EDXAFS and EDXRD, utilizing synchrotron radiation white light to theoretically achieve microsecond level characterization speed and temporal resolution, providing a possible method for in-situ real-time characterization of material structures.”
    • NUCLEAR TECHNIQUES   Vol. 42, Issue 12, (2019)

    • DOI：10.11889/j.0253-3219.2019.hjs.42.120102    

      CLC： TL99

    • Received：12 August 2019，

      Revised：31 October 2019，

      Published：10 December 2019

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  • LIU Zhijie LUO Zhenlin.Simultaneous quick measurements of combined synchrotron EDXAFS and EDXRD[J].NUCLEAR TECHNIQUES,2019,42(12):8-12. DOI： 10.11889/j.0253-3219.2019.hjs.42.120102.

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