A method for material identification based on X-ray dual-energy backscatter detection
ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS|更新时间:2024-10-25
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A method for material identification based on X-ray dual-energy backscatter detection
“In the field of safety inspection, new material classification and identification methods provide new ideas for detecting prohibited items. Through X-ray backscatter imaging technology, the equivalent atomic number information of the substance is analyzed to enhance the detector's signal-to-noise ratio and recognition ability.”
NUCLEAR TECHNIQUESVol. 42, Issue 6, (2019)
作者机构:
公安部第三研究所 上海 200031
作者简介:
SHEN Tianming, male, born in 1981, graduated from Fudan University in 2007, focusing on radiation imaging technology
基金信息:
National Key Research and Development Program(2016YFC0800904)
SHEN Tianming,CHEN Jiamin,LI Weijiao.A method for material identification based on X-ray dual-energy backscatter detection[J].NUCLEAR TECHNIQUES,2019,42(06):1-5.
SHEN Tianming,CHEN Jiamin,LI Weijiao.A method for material identification based on X-ray dual-energy backscatter detection[J].NUCLEAR TECHNIQUES,2019,42(06):1-5. DOI: 10.11889/j.0253-3219.2019.hjs.42.060201.
A method for material identification based on X-ray dual-energy backscatter detection