Effects of the probe divergence degree on the imaging quality of multi-slice 3D ptychography
SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS|更新时间:2024-10-25
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Effects of the probe divergence degree on the imaging quality of multi-slice 3D ptychography
封面论文
“The scanning coherent diffraction imaging technology has achieved success in the fields of biology and materials, and the multi slice 3D imaging method has opened up a new path for efficient and low-dose imaging.”
NUCLEAR TECHNIQUESVol. 42, Issue 5, (2019)
作者机构:
1.中国科学院上海应用物理研究所 上海 201800
2.中国科学院上海高等研究院 上海 201210
3.中国科学院大学 北京 100049
4.上海科技大学 上海 201210
作者简介:
NIE Wei, male, born in 1992, graduated from Lanzhou University in 2013, master student, focusing on coherent diffraction imaging
NIE Wei,XU Zijian,TAO Xulei,et al.Effects of the probe divergence degree on the imaging quality of multi-slice 3D ptychography[J].NUCLEAR TECHNIQUES,2019,42(05):1-9.
NIE Wei,XU Zijian,TAO Xulei,et al.Effects of the probe divergence degree on the imaging quality of multi-slice 3D ptychography[J].NUCLEAR TECHNIQUES,2019,42(05):1-9. DOI: 10.11889/j.0253-3219.2019.hjs.42.050101.
Effects of the probe divergence degree on the imaging quality of multi-slice 3D ptychography封面论文