Design and verification of test method for the single event effect in flash-based FPGA

YANG Zhenlei; WANG Xiaohui; SU Hong; LIU Jie; YANG Haibo; CHENG Ke; TONG Teng

doi:10.11889/j.0253-3219.2015.hjs.38.020404

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Design and verification of test method for the single event effect in flash-based FPGA

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- Design and verification of test method for the single event effect in flash-based FPGA
- NUCLEAR TECHNIQUES Vol. 38, Issue 2, Article number: 020404(2015)
- 作者机构：
  
  1. 中国科学院近代物理研究所,兰州,730000
  2. 中国科学院大学,北京,100049
  3. 西北师范大学,兰州,730000
- 作者简介：
- 基金信息：
- DOI：10.11889/j.0253-3219.2015.hjs.38.020404
  CLC：
- Published：02 February 2015
- 稿件说明：
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YANG Zhenlei, WANG Xiaohui, SU Hong, et al. Design and verification of test method for the single event effect in flash-based FPGA[J]. Nuclear techniques, 2015, 38(2): 020404
DOI：

YANG Zhenlei, WANG Xiaohui, SU Hong, et al. Design and verification of test method for the single event effect in flash-based FPGA[J]. Nuclear techniques, 2015, 38(2): 020404 DOI： 10.11889/j.0253-3219.2015.hjs.38.020404.

摘要

随着现场可编程门阵列(Field Programmable Gate Array

FPGA)在现代航天领域的广泛应用，FPGA的单粒子效应(Single Event Effect

SEE)逐渐成为人们的研究热点。选择Microsemi公司Flash型FPGA分布范围最广的可编程逻辑资源VersaTile和对单粒子效应敏感的嵌入式RAM单元RAM Block作为单粒子效应的主要测试对象，提出了两种不同的单粒子效应测试方法；然后，使用仿真工具ModelSim对提出的两种电路的可行性进行了仿真验证；最后，基于自主研发的实验测试平台，在兰州重离子加速器(Heavy Ion Research Facility in Lanzhou

HIRFL)上使用86Kr束进行了束流辐照实验，实验结果表明，测试方法合理有效。

Abstract

Background: With the increased application of Field Programmable Gate Array (FPGA) in the field of spaceflight

Single Event Effect (SEE) of FPGA is attracting more and more attentions recently. Purpose: The aim is to study single event effect in flash-based FPGA manufactured by Microsemi. Methods: VersaTile and RAM Block from the flash-based FPGA are selected as the research object. First of all

the simulation verification of the method was performed by using ModelSim toolkit. Then the experimental tests of FPGA samples were carried out using SEE testbed based on the Heavy Ion Research Facility in Lanzhou (HIRFL). Results and Conclusion: The simulation results verify that the test methods are effective

and the Single Event Upset (SEU) are detected timely and accurately. Experimental results on the SEE test base using 86Kr of HIRFL showed its rationality and validation. Abstract

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