Depth determination of Fe  +ions implanted into wheat seeds using  characteristic X-ray spectrum method

Xie Hongmei    Wei Zengquan    Li Wenjian

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Depth determination of Fe +ions implanted into wheat seeds using characteristic X-ray spectrum method

更新时间：2021-04-09

- Depth determination of Fe +ions implanted into wheat seeds using characteristic X-ray spectrum method
- NUCLEAR TECHNIQUES Issue 2, (1997)
- 作者机构：
  
  中国科学院近代物理研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： TL271.7
- Published：01 February 1997
- 稿件说明：
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[1]颉红梅,卫增泉,李文建.特征X射线能谱法测定Fe~+注入小麦种子的深度[J].核技术,1997(02):42-45.

Xie Hongmei Wei Zengquan Li Wenjian. Depth determination of Fe +ions implanted into wheat seeds using characteristic X-ray spectrum method[J]. Nuclear techniques, 1997, (2).
[1]颉红梅,卫增泉,李文建.特征X射线能谱法测定Fe~+注入小麦种子的深度[J].核技术,1997(02):42-45. DOI：

Xie Hongmei Wei Zengquan Li Wenjian. Depth determination of Fe +ions implanted into wheat seeds using characteristic X-ray spectrum method[J]. Nuclear techniques, 1997, (2). DOI：

摘要

用１１０ｋｅＶＦｅ＋离子束垂直注入小麦种胚后，在扫描电子显微镜上沿种子纵沟剖面，在不同深度上测量Ｆｅ元素被激发出的特征Ｘ射线强度分布。结果表明分布呈指数衰减，与晶体中的热扩散分布相类似，并对此进行了讨论。

Abstract

The intensity distribution of characteristic X-rays from Fe element at different depths of embryo of a wheat seed implanted vertically by 110keV Fe +ions was measured in SEM along the longitudinal channel section. It was shown that the distribution was of exponential decrease similar to the case of thermal diffusion in crystals.

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