Leakage current of the 4000 series CMOS devices induced by  total dose ionizing radiation

Yu Xuefeng    Ren Diyuan    Lu Wu    Zhang Guoqiang  Guo Qi    Yan Rongliang

您当前的位置：

首页 >

文章列表页 >

Leakage current of the 4000 series CMOS devices induced by total dose ionizing radiation

更新时间：2021-04-09

- Leakage current of the 4000 series CMOS devices induced by total dose ionizing radiation
- NUCLEAR TECHNIQUES Issue 1, (1997)
- 作者机构：
  
  中国科学院新疆物理研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： TL811
- Published：01 January 1997
- 稿件说明：
移动端阅览
[1]余学锋,任迪远,陆妩,张国强,郭旗,严荣良.4000系列CMOS器件的电离辐射感生漏电流[J].核技术,1997(01):25-29.

Yu Xuefeng Ren Diyuan Lu Wu Zhang Guoqiang Guo Qi Yan Rongliang. Leakage current of the 4000 series CMOS devices induced by total dose ionizing radiation[J]. Nuclear techniques, 1997, (1).
[1]余学锋,任迪远,陆妩,张国强,郭旗,严荣良.4000系列CMOS器件的电离辐射感生漏电流[J].核技术,1997(01):25-29. DOI：

Yu Xuefeng Ren Diyuan Lu Wu Zhang Guoqiang Guo Qi Yan Rongliang. Leakage current of the 4000 series CMOS devices induced by total dose ionizing radiation[J]. Nuclear techniques, 1997, (1). DOI：

摘要

研究分析了４０００系列ＣＭＯＳ器件电离辐射感生漏电流的产生机制、变化特征及其与加固水平的关系；控讨了辐射感生静态功耗电流，其中特别是场氧化层漏电流的加固抑制方法

Abstract

The mechanism and characteristics have been studied of leakage current of the 4000 series CMOS devices induced by the total ionizing radiation.The method of restraining the leakage

especially the leakage in the field oxide region

is discussed.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Protective effect and mechanism of citrulline on intestinal injury induced by radiation in mice

Survey of radiation monitoring system for magnetic confinement fusion device

Review on irradiation effects on quality of frozen meat food

Evaluation of radiation effect on tumor cells by the uptake rate of ¹⁸F-FDG in vitro

Total dose effect of three-terminal regulators

Related Author

FENG Jundong

LIU Liang

LIU Wenqian

LI Qian

TIAN Liuxin

HE Chengyu

BO Hongyu

WANG Weitai

Related Institution

Weifang Peoples Hospital

Nanjing University of Aeronautics and Astronautics

University of Science and Technology of China

Hefei Institutes of Physical Science, Chinese Academy of Sciences

Institute of Radiation Protection

AI问答

Address：2019 Jialuo Road, Jiading, Shanghai, China Postal code：201800
Tel：021-39194977 Email：LHB@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.
Total Visits：880840 Visits Today：367

⁰