Atomic scale observation o flatent tracks induced by ions

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Atomic scale observation o flatent tracks induced by ions

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- Atomic scale observation o flatent tracks induced by ions
- NUCLEAR TECHNIQUES Issue 10, (1996)
- 作者机构：
  
  1. 中国科学院高能物理研究所
  2. 北京大学重离子物理研究所
  3. 中国科学院高能物理研究所北京大学重离子物理研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： TL362
- Published：01 October 1996
- 稿件说明：
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[1]翟鹏济,邢宇翔,张颖,冯松林,康一秀,唐孝威,王宇钢,赵渭江,颜莎.荷电离子轰击靶材料损伤潜径迹的原子水平观测研究[J].核技术,1996(10):585-589.

Atomic scale observation o flatent tracks induced by ions[J]. Nuclear techniques, 1996, (10).
[1]翟鹏济,邢宇翔,张颖,冯松林,康一秀,唐孝威,王宇钢,赵渭江,颜莎.荷电离子轰击靶材料损伤潜径迹的原子水平观测研究[J].核技术,1996(10):585-589. DOI：

Atomic scale observation o flatent tracks induced by ions[J]. Nuclear techniques, 1996, (10). DOI：

摘要

叙述了用扫描隧道显微镜（ＳＴＭ）和原子力显微镜（ＡＦＭ）观测研究荷电离子轰击靶材料损伤潜径达的状况和进展．观测研究了Ａｕ离子和Ｈ＋轰击高定向石墨（ＨＯＰＧ）的ＳＴＭ．给出了损伤形貌、损伤范围、表面损伤数密度和离子注入剂量的关系，并对损伤过程进行了分析和讨论．

Abstract

The topography and size of the damaged area on the surface of HOPG bombarded by An ions and H+are studied.The correlation between the number density and ion lose is also given.The possible process of damage is discussed.

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