X-ray diffraction and positron annihilation study on crystalline process of Fe73.5Cu1Nb3Si13.5B9 amorphous alloy

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X-ray diffraction and positron annihilation study on crystalline process of Fe_73.5Cu₁Nb₃Si_13.5B₉ amorphous alloy

更新时间：2021-04-09

- X-ray diffraction and positron annihilation study on crystalline process of Fe_73.5Cu₁Nb₃Si_13.5B₉ amorphous alloy
- NUCLEAR TECHNIQUES Issue 1, (1995)
- 作者机构：
  
  1. 南京大学
  2. 北京科技大学
  3. 中山大学
  4. 南京大学北京科技大学中山大学
- 作者简介：
- 基金信息：
- DOI：
  CLC： TG139.8
- Published：01 January 1995
- 稿件说明：
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[1]吴奕初,滕敏康,夏元复,常香荣,杨会生,田中卓.Fe_（73．5）Cu_1Nb_3Si_（13．5）B_9非晶合金化过程的X射线[J].核技术,1995(01):24-27.

X-ray diffraction and positron annihilation study on crystalline process of Fe_73.5Cu₁Nb₃Si_13.5B₉ amorphous alloy[J]. Nuclear techniques, 1995, (1).
[1]吴奕初,滕敏康,夏元复,常香荣,杨会生,田中卓.Fe_（73．5）Cu_1Nb_3Si_（13．5）B_9非晶合金化过程的X射线[J].核技术,1995(01):24-27. DOI：

X-ray diffraction and positron annihilation study on crystalline process of Fe_73.5Cu₁Nb₃Si_13.5B₉ amorphous alloy[J]. Nuclear techniques, 1995, (1). DOI：

摘要

采用Ｘ射线衍射和正电子湮没多普勒展宽测量相结合，研究了纳米晶态材料Ｆｅ７３．５Ｃｕ１Ｎｂ３Ｓｉ１３．５Ｂ９的结构随退火温度的变化。实验结果表明：急冷非品样品在４８０℃开始明显晶化，基体中析出体心立方结构的α－Ｆｅ（Ｓｉ）固溶体。随着退火温度的升高，非晶漫射峰不断减弱，而晶态相的衍射谱逐渐增强。进一步计算对衍射谱的分离，给出了品化分数和非晶相平均原子间距随退火温度的变化规律。正电子湮没实验证实了约５５０℃退火时样品内出现以Ｎｂ、Ｂ原子为主的晶界非晶相，Ｓ参数随退火温度的变化与非晶相平均原子间距随退火温度的变化规律一致。

Abstract

The structure of Fe73.5Cu1Nb3Si13.5B9 nanocrystalline material as a function ofannealing temperature was investigated by X-ray diffraction（XRD） and positronannihilation technique（PAT）. The experimental results indicate that the amorphoussample startS nucleation and primary incrystallization at 480℃

and b.c.c. α-Fe（Si）solution separates out from the matrix. The amorphous diffusion peak decreases andthe crystalline diffraction peaks increase with annealing temperature. The crystallinefraction and the average distance among atoms in amorphous phase as a function ofannealing temperature are computed based on the diffraction spectra. The PATexperiments prove that the amorphous Phase at grain boundary mainly containing Nband B atoms exists in the sample after annealing at about 550℃。The change ofS-parameter is in accordance with that of the atomic average distance in amorphousphase with annealing temperature.

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