Based on the theory of x-ray fluorescence analysis

two new terms of x-ray sampling

i.e."equivalent plane"and"equivalent source-sample distance"

have been introduced

with which the influence of a rough rock surface on x-ray sampling can be equivalent to the influence of the changes of source-sample distance for a smooth rock surface.The ratio of the characteristic to scattered radiation has also been used as a basic parameter for the unevenness effect correction.The experiments with artificial rock models show that the average of deviation of the ratios of the characteristic to scattered radiation between rough artificial rock surface and smooth surface is less than 5% for roughness less than 10mm.on three sites of Sn

Mo and Pb-Zn deposits have given satisfactory results.