Application of ultra-thin window Si（Li） detector in some experiments

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Application of ultra-thin window Si（Li） detector in some experiments

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- Application of ultra-thin window Si（Li） detector in some experiments
- NUCLEAR TECHNIQUES Issue 4, (1994)
- 作者机构：
  
  中国科学院上海原子核研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： TL814
- Published：01 April 1994
- 稿件说明：
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[1]刘惠珍,朱福英,朱德彰,曹德新,沈浩元,浦世节.超薄窗Si（Li）探测器在实验中的应用[J].核技术,1994(04):242-245.

Application of ultra-thin window Si（Li） detector in some experiments[J]. Nuclear techniques, 1994, (4).
[1]刘惠珍,朱福英,朱德彰,曹德新,沈浩元,浦世节.超薄窗Si（Li）探测器在实验中的应用[J].核技术,1994(04):242-245. DOI：

Application of ultra-thin window Si（Li） detector in some experiments[J]. Nuclear techniques, 1994, (4). DOI：

摘要

用超薄窗Ｓｉ（Ｌｉ）探测器测量低能Ｘ射线，将传统的ＰＩＸＥ谱测量范围推广到如Ｓｉ、Ａｌ、Ｎａ等低原子序数元素。还对超薄窗Ｓｉ（Ｌｉ）探测器的具体应用作了描述。

Abstract

An ultra-thin window Si（Li） detector used for measuring low energy X-rays is designed. The PIXE spectrum range has extended to still lower energies of characteristic X-rays originated from St

Al and Na. Some practical applications of the detector are also presented.

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