Measurement of elemental content in thin and thick samples by PIXE with a personal computer

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Measurement of elemental content in thin and thick samples by PIXE with a personal computer

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- Measurement of elemental content in thin and thick samples by PIXE with a personal computer
- NUCLEAR TECHNIQUES Issue 9, (1994)
- 作者机构：
  
  中国科学技术大学
- 作者简介：
- 基金信息：
- DOI：
  CLC： O657.34
- Published：01 September 1994
- 稿件说明：
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[1]杨炳忻,卢钦棠,林馨思,虞孝麒,徐克尊,项志遴.用微机化的PIXE方法测量薄样和厚样样品的元素含量[J].核技术,1994(09):513-516.

Measurement of elemental content in thin and thick samples by PIXE with a personal computer[J]. Nuclear techniques, 1994, (9).
[1]杨炳忻,卢钦棠,林馨思,虞孝麒,徐克尊,项志遴.用微机化的PIXE方法测量薄样和厚样样品的元素含量[J].核技术,1994(09):513-516. DOI：

Measurement of elemental content in thin and thick samples by PIXE with a personal computer[J]. Nuclear techniques, 1994, (9). DOI：

摘要

在ＩＢＭ微机上建立了ＰＩＸＥ实验的数据采集系统和数据分析系统，并对气溶胶等样品进行了ＰＩＸＥ实验分析研究，取得了满意的结果。

Abstract

A data acquisition and processing system for PIXE experiments has been established based on a personal computer. Analyses of the thin film standard samples and some gasoloid samples were carried out with the PIXE equipment.

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