Temperature effect of the high pressure ionization chamber and its output circuits

Wang Mingqian Sun Jinhua Shi Qicun

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Temperature effect of the high pressure ionization chamber and its output circuits

更新时间：2021-04-09

- Temperature effect of the high pressure ionization chamber and its output circuits
- NUCLEAR TECHNIQUES Issue 3, (1993)
- 作者机构：
  
  1. 中国科学技术大学
  2. 中国科学技术大学,合肥,230027
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：01 March 1993
- 稿件说明：
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[1]王明谦,孙金华,施启存.高气压电离室及其信号输出电路的温度效应的研究[J].核技术,1993(03):166-168.

Wang Mingqian Sun Jinhua Shi Qicun. Temperature effect of the high pressure ionization chamber and its output circuits[J]. Nuclear techniques, 1993, (3): 166-168.
[1]王明谦,孙金华,施启存.高气压电离室及其信号输出电路的温度效应的研究[J].核技术,1993(03):166-168. DOI：

Wang Mingqian Sun Jinhua Shi Qicun. Temperature effect of the high pressure ionization chamber and its output circuits[J]. Nuclear techniques, 1993, (3): 166-168. DOI：

摘要

研究了高气压电离室、输出电路部分随温度改变时对脉冲信号频率产生的影响

为电离室及输出电路的设计提供了依据。

Abstract

The influence of temperature change on the high pressure ionization chamber and its A- F converter output circuits is studied. The experimental result is useful for the design of these devices.

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Performance tests of high-pressure and large-volume ionization chambers

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Related Author

Wang Mingqian Shi Qicun Sun Jinhua

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2 Huang Ji2 Wu Guoxin1 Wang Kun2 Tian Baolin1 Wang Zhipeng2 Jin Sunjun2 Qi Yaping2 Yang Xiaoyuan2

Related Institution

Gwangdong Institute of Analysis

(Key Laboratory of Modern Measurement and Control Technology, Beijing Information Science and Technology University, 100192, China)2(Division of Ionizing Radiation Metrology, National Institute of Metrology (), Beijing, ,)

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