Ionizing radiation effect and damage evaluation of linear integrated circuits

Ren Diyuan Lu Wu Yu Xuefeng Fan Long Gao Wenyu Yan Rongliang

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Ionizing radiation effect and damage evaluation of linear integrated circuits

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- Ionizing radiation effect and damage evaluation of linear integrated circuits
- NUCLEAR TECHNIQUES Issue 9, (1993)
- 作者机构：
  
  1. 中国科学院新疆物理研究所
  2. 中国科学院新疆物理研究所,乌鲁木齐,830011
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：01 September 1993
- 稿件说明：
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[1]任迪远,陆妩,余学峰,范隆,高文钰,严荣良.线性集成电路的辐照响应和电离辐射损伤评估[J].核技术,1993(09):551-557.

Ren Diyuan Lu Wu Yu Xuefeng Fan Long Gao Wenyu Yan Rongliang. Ionizing radiation effect and damage evaluation of linear integrated circuits[J]. Nuclear techniques, 1993, (9): 551-557.
[1]任迪远,陆妩,余学峰,范隆,高文钰,严荣良.线性集成电路的辐照响应和电离辐射损伤评估[J].核技术,1993(09):551-557. DOI：

Ren Diyuan Lu Wu Yu Xuefeng Fan Long Gao Wenyu Yan Rongliang. Ionizing radiation effect and damage evaluation of linear integrated circuits[J]. Nuclear techniques, 1993, (9): 551-557. DOI：

摘要

利用用于电离辐射效应研究的运算放大器计算机测试系统以及测试分析和数据处理软件对十几种运算放大器进行了

Coγ射线、1.5MeV电子的电离辐射损伤试验及其室温和加温退火特性研究。同时

探讨了运算放大器电离辐射损伤水平的评估方法和损伤机制。

Abstract

A measurement

analysis and data processing system has been developed to study the total dose effects on linear integrated circuits. By means of this system

the ionizing radiation effects and the annealing characteristics of various operational amplifiers have been investigated. Damage and failure mechanism were analysed

and a method was presented to evaluate ionizing radiation damage to different types of operatioal amplifiers used in radiation environment typically.

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