A detection system for the extended X-ray absorption fine structure （EXAFS） spectrometer is described in detail. The plateau characteristic

absorption curves and linearity of the system are measured using X-rays with energy about 10keV. An oscillation phenomenon near K-shell absorption edge of nickel sample is observed by this detection system. The results are more accurate than those obtained by a detection system which consists of a proportional counter as the front detector and a NaI（Tl） scintillation counter as the rear detector.