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Electrical performance analysis of electron irradiated SiGe HBT and Si BJT
更新时间:2021-03-12
    • Electrical performance analysis of electron irradiated SiGe HBT and Si BJT

    • NUCLEAR TECHNIQUES   Issue 3, (2005)
    • CLC: O472
    • Published:01 March 2005

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  • HUANG Wentao WANG Jilin LIU Zhinong CHEN Changchun CHEN Peiyi QIAN Peixin. Electrical performance analysis of electron irradiated SiGe HBT and Si BJT[J]. Nuclear techniques, 2005, (3): 213-216. DOI:

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Related Author

WEI Sheng
XIN Yong
LI Cuihong
LI Huan
LIN Libin
XU Xuechun
侯春宇
韩兆磊

Related Institution

Department of Physics, College of Science, Nanchang University
Key Laboratory of Radiation Physics and Technology, Sichuan University Ministry of Education
Key Laboratory of Beam Technology and Materials Modification of Ministry of Education,College of Nuclear Sciences and Technology,Beijing Normal University
中国科学院新疆理化技术研究所
天津电源研究所 乌鲁木齐 830011 中国科学院研究生院
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