Influence of thickness of gate oxide layer on the irradiation response of CMOS op-amp

LU Wu1 REN Diyuan1 GUO Qi1    YU Xuefeng1            ZHENG Yufeng2 ZHANG Jun2                   1

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Influence of thickness of gate oxide layer on the irradiation response of CMOS op-amp

更新时间：2021-03-12

- Influence of thickness of gate oxide layer on the irradiation response of CMOS op-amp
- NUCLEAR TECHNIQUES Issue 3, (2005)
- 作者机构：
  
  1. 中国科学院新疆理化技术研究所
  2. 新疆大学,乌鲁木齐,830011
  3. ,乌鲁木齐,830046
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN72
- Published：01 March 2005
- 稿件说明：
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[1]陆妩,任迪远,郭旗,余学锋,郑毓峰,张军.栅氧层厚度与CMOS运算放大器电离辐射效应的关系[J].核技术,2005(03):227-230.

LU Wu1 REN Diyuan1 GUO Qi1 YU Xuefeng1 ZHENG Yufeng2 ZHANG Jun2 1. Influence of thickness of gate oxide layer on the irradiation response of CMOS op-amp[J]. Nuclear techniques, 2005, (3): 227-230.
[1]陆妩,任迪远,郭旗,余学锋,郑毓峰,张军.栅氧层厚度与CMOS运算放大器电离辐射效应的关系[J].核技术,2005(03):227-230. DOI：

LU Wu1 REN Diyuan1 GUO Qi1 YU Xuefeng1 ZHENG Yufeng2 ZHANG Jun2 1. Influence of thickness of gate oxide layer on the irradiation response of CMOS op-amp[J]. Nuclear techniques, 2005, (3): 227-230. DOI：

摘要

介绍了在干氧和氢氧合成两种不同工艺和不同栅氧层厚度情况下

CMOS 运算放大器电路的电离辐照响应规律。并通过对其单管特性及内部单元电路辐照变化的分析比较

探讨了栅氧层厚度的变化与运放电路辐照损伤之间的相互依赖关系。结果显示

适当地减薄栅氧层厚度

可相应地减少辐照感生氧化物电荷和界面态引起的跨导衰降

从而使 CMOS 运放电路的抗辐射特性得到明显的改善。

Abstract

By comparing the characteristic changes of transistors

subsidiary and entire circuits of CMOS amplifiers with different thickness of gate oxide layer

influence of the thickness of gate oxide layer on the op-amps’ irradiation response was investigated. It was shown that by lessening the thickness of gate oxide layer properly

degradation of transconductance of the op-amps’ transistors induced by radiation-generated oxide charges and interface states can be reduced

therefore

the ability of CMOS amp to resist radiation can be improved.

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Related Author

LU Wu GUO Qi YU Xuefeng REN Diyuan

郭旗

余学锋

任迪远

郑毓峰

张军

张国强

严荣良

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Xinjiang Institute of Physics, Chinese Academy of Sciences, Urumqi 830011) ZHENG Yufeng ZHANG Jun

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Wang Yingmin

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