Pulsed total dose effect test technique and damage laws study

LUO Yinhong GONG Jiancheng YAO Zhibin GUO Hongxia ZHANG Fengqi LI Yonghong GUO Ning

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Pulsed total dose effect test technique and damage laws study

更新时间：2021-03-12

- Pulsed total dose effect test technique and damage laws study
- NUCLEAR TECHNIQUES Issue 10, (2005)
- 作者机构：
  
  1. 西北核技术研究所
  2. 西北核技术研究所,西安,710024
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN407
- Published：01 October 2005
- 稿件说明：
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[1]罗尹虹,龚建成,姚志斌,郭红霞,张凤祁,李永宏,郭宁.脉冲总剂量效应测试技术及其损伤规律研究[J].核技术,2005(10):761-765.

LUO Yinhong GONG Jiancheng YAO Zhibin GUO Hongxia ZHANG Fengqi LI Yonghong GUO Ning. Pulsed total dose effect test technique and damage laws study[J]. Nuclear techniques, 2005, (10): 761-765.
[1]罗尹虹,龚建成,姚志斌,郭红霞,张凤祁,李永宏,郭宁.脉冲总剂量效应测试技术及其损伤规律研究[J].核技术,2005(10):761-765. DOI：

LUO Yinhong GONG Jiancheng YAO Zhibin GUO Hongxia ZHANG Fengqi LI Yonghong GUO Ning. Pulsed total dose effect test technique and damage laws study[J]. Nuclear techniques, 2005, (10): 761-765. DOI：

摘要

建立了基于PCI插卡式虚拟仪器的脉冲总剂量效应在线测试系统

详细说明了其工作原理和技术指标。利用该系统研究了脉冲辐照后CMOS器件总剂量损伤以及时间关联的退火响应

包括不同栅偏压对总剂量损伤和退火行为的影响

以及氧化物陷阱电荷、界面陷阱电荷引起的阈值电压漂移与退火时间的关联情况

并从物理机理上进行了详细的分析。

Abstract

A pulsed total dose effect in-circuit test system based on PCI card virtual instrument was developed. Working principle and technical specifications were introduced in detail. Pulsed total dose damage and time-dependent annealing response on CMOS devices were studied by utilizing this system

including influence of different gate bias voltage on total damage and annealing behavior

as well as threshold voltage shift due to oxide trap charge and interface trap charge versus annealing time. Physical mechanism was discussed in detail.

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Related Author

王圆明

张科营

姚志斌

郭红霞

张凤祁

LUO Yinhong ZHANG Fengqi GUO Hongxia YAO Zhibin ZHANG Keying WANG Yuanming

李小刚

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Related Institution

Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000, China) 2

中国科学院研究生院

Xinjiang Technical Institute of Physics and Chemistry,Urumqi 830011,China) 2

新疆大学物理学院

中国科学院研究生院北京

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