The ΔE-Q3D method for AMS measurement of <sup>32</sup>Si

GONG Jie1 LI Chaoli1 WANG Wei1 LU Liyan1 LI Shizhuo2 HE Ming1 JIANG Shan1 1

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The ΔE-Q3D method for AMS measurement of ³²Si

更新时间：2021-03-05

- The ΔE-Q3D method for AMS measurement of ³²Si
- NUCLEAR TECHNIQUES Vol. 33, Issue 7, (2010)
- 作者机构：
  
  1. 中国原子能科学研究院
  2. 广西大学物理科学与工程技术学院
- 作者简介：
- 基金信息：
  
  国家自然科学基金项目(10875176)资助
- DOI：
  CLC： TL81
- Published：01 July 2010
- 稿件说明：
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[1]龚杰,李朝历,王伟,陆丽燕,李世琢,何明,姜山.AMS测量~(32)Si的ΔE-Q3D方法[J].核技术,2010,33(07):490-496.

GONG Jie1 LI Chaoli1 WANG Wei1 LU Liyan1 LI Shizhuo2 HE Ming1 JIANG Shan1 1. The ΔE-Q3D method for AMS measurement of ³²Si[J]. Nuclear techniques, 2010, 33(7): 490-496.
[1]龚杰,李朝历,王伟,陆丽燕,李世琢,何明,姜山.AMS测量~(32)Si的ΔE-Q3D方法[J].核技术,2010,33(07):490-496. DOI：

GONG Jie1 LI Chaoli1 WANG Wei1 LU Liyan1 LI Shizhuo2 HE Ming1 JIANG Shan1 1. The ΔE-Q3D method for AMS measurement of ³²Si[J]. Nuclear techniques, 2010, 33(7): 490-496. DOI：

摘要

32Si（

40a）是Si的唯一长寿命放射性核素

在100-1000a时间尺度的同位素地质定年和硅的全球生物地球化学循环研究中有不可替代的重要地位。加速器质谱技术（AMS）的灵敏度高、样品用量少、测量时间短

是测量32Si的最合适方法。本实验室正在着力建立32Si的AMS测量法。在游泳池堆中辐照31P和30Si生产32Si;通过实验确定了样品的化学形式、离子源导电介质种类及其比例和离子源引出形式;建立了从辐照样品提取32Si和稀释高含量样品的化学流程。经多次实验条件摸索和改进

成功测得了含量为10-13水平的样品中的32Si计数

灵敏度好于1.5×10-14

成功建立了AMS高灵敏测量32Si的ΔE-Q3D方法。

Abstract

32Si

the only long-life(~140 a) radioisotope of silicon

plays a unique role in geochronometry in the range of 100-1000 years

and in research of the global biogeochemical silica cycle.Because of its ultra high sensitivity

minute sample amount and short measurement time

the accelerator mass spectrometry(AMS) is the most proper method for detecting 32Si.China Institute of Atomic Energy has been making efforts in establishing the ultra-sensitive method of 32Si determination via AMS.31P and 30Si targets are irradiated in a swimming pool reactor to produce 32Si.Chemical procedures to extract the 32Si from the irradiated targets have been decided

along with electric conductor materials and the mixing ratio

the negative ion formation method

and processes to dilute the solutions to form high 32Si abundance samples.After several tests and improvements of the experimental conditionals

we were able to measure the sample at the abundance of 10-13 in a sensitivity of better than 1.5×10-14.In this paper

we report our progresses in establishing the AMS-based ΔE-Q3D method for 32Si determination.

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Related Institution

State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China

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College of Materials, Xiamen University

University of Chinese Academy of Sciences

Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Jiading Campus

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The ΔE-Q3D method for AMS measurement of 32Si

DOI：

摘要

Abstract

关键词

Keywords

references

The ΔE-Q3D method for AMS measurement of ³²Si