Microstructure analysis of D-RDX by small angle X-ray scattering

YAN Guanyun1 HUANG Chaoqiang1 XIA Qingzhong1 CHEN Bo1 HUANG Ming2 NIE Fude2 WU Zhonghua3 1

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Microstructure analysis of D-RDX by small angle X-ray scattering

更新时间：2021-03-05

- Microstructure analysis of D-RDX by small angle X-ray scattering
- NUCLEAR TECHNIQUES Vol. 33, Issue 3, (2010)
- 作者机构：
  
  1. 中国工程物理研究院核物理与化学研究所
  2. 中国工程物理研究院化工材料研究所
  3. 中国科学院高能物理研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： O434.19
- Published：01 March 2010
- 稿件说明：
移动端阅览
[1]闫冠云,黄朝强,夏庆中,陈波,黄明,聂福德,吴忠华.降感环三甲撑三硝胺微缺陷小角X射线散射研究[J].核技术,2010,33(03):161-164.

YAN Guanyun1 HUANG Chaoqiang1 XIA Qingzhong1 CHEN Bo1 HUANG Ming2 NIE Fude2 WU Zhonghua3 1. Microstructure analysis of D-RDX by small angle X-ray scattering[J]. Nuclear techniques, 2010, 33(3): 161-164.
[1]闫冠云,黄朝强,夏庆中,陈波,黄明,聂福德,吴忠华.降感环三甲撑三硝胺微缺陷小角X射线散射研究[J].核技术,2010,33(03):161-164. DOI：

YAN Guanyun1 HUANG Chaoqiang1 XIA Qingzhong1 CHEN Bo1 HUANG Ming2 NIE Fude2 WU Zhonghua3 1. Microstructure analysis of D-RDX by small angle X-ray scattering[J]. Nuclear techniques, 2010, 33(3): 161-164. DOI：

摘要

应用小角X射线散射研究含能材料降感RDX微缺陷结构

给出降感RDX样品材料内部微缺陷尺寸及微缺陷数量信息

分析了降感RDX晶体在生长过程中微缺陷变化趋势。结果表明

降感RDX微缺陷数量密度随晶体粒度增加逐渐降低

微缺陷特征尺度变化较小

另外还存在部分择优取向分布特征的微缺陷

微缺陷密度呈降低趋势。

Abstract

The micro-defects of D-RDX were analyzed by small angle X-ray scattering（SAXS）.Scale and density of micro-defects in the D-RDX of different the qualities during the crystal growing were investigated.The results show that the larger D-RDX crystals have less micro-defect density and better crystal quality.Micro-defects with orientated distributions in the D-RDX indicated anisotropic microstructure in D-RDX.

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