An SEU reliability prediction method for microprocessors of space applications

LI Qiang1 GAO Jie2 LIU Weixin3 1

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An SEU reliability prediction method for microprocessors of space applications

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- An SEU reliability prediction method for microprocessors of space applications
- NUCLEAR TECHNIQUES Vol. 33, Issue 11, (2010)
- 作者机构：
  
  1. 上海航天技术研究院第509研究所
  2. 上海航天技术研究院第804研究所
  3. 上海航天技术研究院第808研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： V44;TP368.1
- Published：01 November 2010
- 稿件说明：
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[1]李强,高洁,刘伟鑫.星用微处理器抗单粒子翻转可靠性预示研究[J].核技术,2010,33(11):832-835.

LI Qiang1 GAO Jie2 LIU Weixin3 1. An SEU reliability prediction method for microprocessors of space applications[J]. Nuclear techniques, 2010, 33(11): 832-835.
[1]李强,高洁,刘伟鑫.星用微处理器抗单粒子翻转可靠性预示研究[J].核技术,2010,33(11):832-835. DOI：

LI Qiang1 GAO Jie2 LIU Weixin3 1. An SEU reliability prediction method for microprocessors of space applications[J]. Nuclear techniques, 2010, 33(11): 832-835. DOI：

摘要

运用程序占空比概念

对星用微处理器动态和静态单粒子翻转率之间的关系进行了研究

实现了星用微处理器动态单粒子翻转率的预示。将星用微处理器在轨运行期间满足单粒子翻转指标要求的概率与单粒子翻转率和飞行寿命联系起来

探讨了器件级和系统级的星用微处理器抗单粒子翻转可靠性预示方法。

Abstract

In this article

the relationship between static SEU(Single Event Upset) rate and dynamic SEU rate of microprocessor for satellites is studied by using process duty cycle concept

in an attempt to predict the dynamic SEU rate.By combining the probability of microprocessor for satellites

which meets the requirement of SEU rate

with the SEU rate and flight period

the prediction method of device-level and system-level anti-SEU reliability are given.

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An SEU rate prediction method for microprocessors of space applications

Related Author

GAO Jie1

2 LI Qiang3 1

Related Institution

Institute of Electronic and Communication Engineering,Shanghai Jiaotong University,Shanghai 200240,China) 2

上海航天技术研究院第八○四研究所

上海航天技术研究院第五○九研究所

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