LUO Yinhong ZHANG Fengqi GUO Hongxia YAO Zhibin ZHANG Keying WANG Yuanming. Total dose effect on floating gate ROMs irradiated by Co-60 γ-rays or pulsed γ-rays[J]. Nuclear techniques, 2010, 33(10): 783-787.
LUO Yinhong ZHANG Fengqi GUO Hongxia YAO Zhibin ZHANG Keying WANG Yuanming. Total dose effect on floating gate ROMs irradiated by Co-60 γ-rays or pulsed γ-rays[J]. Nuclear techniques, 2010, 33(10): 783-787.DOI:
Total dose effect on floating gate ROMs irradiated by Co-60 γ-rays or pulsed γ-rays
Memory radiation effect studies in China have been mainly focused on functionality measurement. According to the present situation
threshold voltage testing method was presented on Floating Gate (FG) memory. FG EPROMs of different integration scales were pre-irradiation by UV lights
followed by irradiation of 60Co γ-rays
or pulsed γ-rays. The total dose effect similarities and differences were studied. The damage mechanism was analyzed. The results showed that unlike MOS and CMOS devices
FG memory threshold voltage shifted more due to pulsed irradiation than 60Co γ-ray irradiation. This is of important reference for choosing the device type for a certain system.