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Design and implement of a test system for front-end ASIC chips
更新时间:2021-03-12
    • Design and implement of a test system for front-end ASIC chips

    • NUCLEAR TECHNIQUES   Vol. 32, Issue 9, (2009)
    • CLC: TN492
    • Published:01 September 2009

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  • QIAN Yi1 SU Hong1 KONG Jie1, 2 DONG Chengfu1 MA Xiaoli1 LI Xiaogang1 1. Design and implement of a test system for front-end ASIC chips[J]. Nuclear techniques, 2009, 32(9): 701-705. DOI:

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